EL

Effendi Leobandung

IBM: 77 patents #12 of 10,852Top 1%
Globalfoundries: 1 patents #454 of 1,311Top 35%
📍 Stormville, NY: #1 of 15 inventorsTop 7%
🗺 New York: #11 of 12,278 inventorsTop 1%
Overall (2017): #80 of 506,227Top 1%
78
Patents 2017

Issued Patents 2017

Showing 26–50 of 78 patents

Patent #TitleCo-InventorsDate
9716367 Semiconductor optoelectronics and CMOS on sapphire substrate Tymon Barwicz, Ning Li, Jean-Olivier Plouchart, Devendra K. Sadana 2017-07-25
9716160 Extended contact area using undercut silicide extensions Soon-Cheon Seo, Tenko Yamashita, Chun-Chen Yeh 2017-07-25
9716030 Aspect ratio for semiconductor on insulator 2017-07-25
9711648 Structure and method for CMP-free III-V isolation Chung-Hsun Lin, Amlan Majumdar, Yanning Sun 2017-07-18
9711617 Dual isolation fin and method of making Cheng-Wei Cheng, Sanghoon Lee 2017-07-18
9704950 Method to form SOI fins on a bulk substrate with suspended anchoring 2017-07-11
9704866 Integrated circuit having dual material CMOS integration and method to fabricate same 2017-07-11
9698239 Growing groups III-V lateral nanowire channels Sanghoon Lee, Renee T. Mo, Brent A. Wacaser 2017-07-04
9698225 Localized and self-aligned punch through stopper doping for finFET Tenko Yamashita 2017-07-04
9691709 Semiconductor device security 2017-06-27
9687181 Semiconductor device to be embedded within a contact lens Ghavam G. Shahidi 2017-06-27
9685410 Semiconductor device security 2017-06-20
9685329 Embedded gallium-nitride in silicon William J. Gallagher, Devendra K. Sadana, Ghavam G. Shahidi 2017-06-20
9685501 Low parasitic capacitance finFET device 2017-06-20
9685521 Lowering parasitic capacitance of replacement metal gate processes Vijay Narayanan 2017-06-20
9679775 Selective dopant junction for a group III-V semiconductor device Kevin K. Chan, Marinus Hopstaken, Young-Hee Kim, Masaharu Kobayashi, Deborah A. Neumayer +3 more 2017-06-13
9673056 Method to improve finFET cut overlay Tenko Yamashita 2017-06-06
9666748 Integrated on chip detector and zero waveguide module structure for use in DNA sequencing 2017-05-30
9660069 Group III nitride integration with CMOS technology Can Bayram, Christopher P. D'Emic, William J. Gallagher, Devendra K. Sadana 2017-05-23
9653464 Asymmetric band gap junctions in narrow band gap MOSFET 2017-05-16
9653347 Vertical air gap subtractive etch back end metal 2017-05-16
9647091 Annealed metal source drain overlapping the gate 2017-05-09
9640536 Method to make dual material finFET on same substrate 2017-05-02
9640442 CMOS fin integration on SOI substrate Tenko Yamashita 2017-05-02
9627266 Dual-semiconductor complementary metal-oxide-semiconductor device Sanghoon Lee, Renee T. Mo, Yanning Sun 2017-04-18