BL

Burn Jeng Lin

TSMC: 11 patents #127 of 2,623Top 5%
📍 Hsinchu, NY: #4 of 34 inventorsTop 15%
Overall (2016): #5,814 of 481,213Top 2%
11
Patents 2016

Issued Patents 2016

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
9529271 Grid refinement method Wen-Chuan Wang, Jaw-Jung Shin, Pei-Yi Liu, Shy-Jay Lin 2016-12-27
9524939 Multiple edge enabled patterning Ming-Feng Shieh, Ya Hui Chang, Ru-Gun Liu, Tsong-Hua Ou, Ken-Hsien Hsieh 2016-12-20
9519225 Systems and methods for high-throughput and small-footprint scanning exposure for lithography Shy-Jay Lin, Jaw-Jung Shin, Wen-Chuan Wang 2016-12-13
9436787 Method of fabricating an integrated circuit with optimized pattern density uniformity Jyuh-Fuh Lin, Pei-Yi Liu, Cheng-Hung Chen, Wen-Chuan Wang, Shy-Jay Lin 2016-09-06
9436788 Method of fabricating an integrated circuit with block dummy for optimized pattern density uniformity Jyuh-Fuh Lin, Pei-Yi Liu, Cheng-Hung Chen, Wen-Chuan Wang, Shy-Jay Lin 2016-09-06
9390891 Apparatus for charged particle lithography system Shih-Chi Wang, Tsung-Chih Chien, Hui-Min Huang, Jaw-Jung Shin, Shy-Jay Lin 2016-07-12
9330933 Method and apparatus for planarizing a polymer layer 2016-05-03
9329488 Grid refinement method Wen-Chuan Wang, Shy-Jay Lin, Pei-Yi Liu, Jaw-Jung Shin 2016-05-03
9291913 Pattern generator for a lithography system Chen-Hua Yu, Tien-I Bao, Chih Wei Lu, Jaw-Jung Shin, Shy-Jay Lin 2016-03-22
9287125 Multiple edge enabled patterning Ming-Feng Shieh, Ya Hui Chang, Ru-Gun Liu, Tsong-Hua Ou, Ken-Hsien Hsieh 2016-03-15
9229332 Systems and methods for high-throughput and small-footprint scanning exposure for lithography Shy-Jay Lin, Jaw-Jung Shin, Wen-Chuan Wang 2016-01-05