KW

Kenji Watanabe

EB Ebara: 5 patents #8 of 183Top 5%
PA Panasonic: 4 patents #329 of 4,214Top 8%
HI Hitachi: 3 patents #231 of 2,733Top 9%
HH Hitachi High-Technologies: 2 patents #104 of 523Top 20%
NS National Institute For Materials Science: 1 patents #23 of 94Top 25%
Nissan Motor Co.: 1 patents #96 of 458Top 25%
Canon: 1 patents #1,398 of 3,266Top 45%
KT Kabushiki Kaisha Toshiba: 1 patents #1,082 of 2,818Top 40%
HC Hitachi Electronics Engineering Co.: 1 patents #1 of 7Top 15%
BC Bandai Co.: 1 patents #1 of 6Top 20%
MI Mizuho Information & Research Institute: 1 patents #1 of 1Top 100%
Overall (2011): #965 of 364,097Top 1%
17
Patents 2011

Issued Patents 2011

Showing 1–17 of 17 patents

Patent #TitleCo-InventorsDate
8076654 Sample surface inspection apparatus and method Masahiro Hatakeyama, Takeshi Murakami, Tohru Satake, Nobuharu Noji 2011-12-13
8072597 Method and its apparatus for inspecting particles or defects of a semiconductor device Hidetoshi Nishiyama, Minori Noguchi, Yoshimasa Ooshima, Akira Hamamatsu, Tetsuya Watanabe +1 more 2011-12-06
8053726 Inspection system by charged particle beam and method of manufacturing devices using the system Mamoru Nakasuji, Nobuharu Noji, Tohru Satake, Masahiro Hatakeyama, Toshifumi Kimba +9 more 2011-11-08
8039781 Physical quantity detecting apparatus and method for driving the same Kenichi Shimomura, Yutaka Abe 2011-10-18
8040503 Method of inspecting a semiconductor device and an apparatus thereof Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Kenji Oka +4 more 2011-10-18
8040414 A/D converter-incorporated solid-state imaging device Toshinobu Nakao, Masayuki Hirota, Masashi Murakami, Masaya Hirose 2011-10-18
D646725 Game device Tsubasa Utsumi, Yusuke Maekawa 2011-10-11
8013315 Charged particle beam apparatus, method of adjusting astigmatism using same and method of manufacturing device using same Takeshi Murakami, Ryo Tajima, Masahiro Hatakeyama, Masatoshi Tsuneoka, Nobuharu Noji 2011-09-06
7976097 Cowl structure of vehicle Hidekazu Saitou 2011-07-12
7952510 Solid-state imaging device, driving method thereof, and camera Kenichi Shimomura 2011-05-31
7952085 Surface inspection apparatus and method thereof Ichiro Ishimaru, Minori Noguchi, Ichiro Moriyama, Yoshikazu Tanabe, Yasuo Yatsugake +2 more 2011-05-31
7941063 Image forming apparatus with loop control Akimichi Suzuki, Hideo Nanataki, Kenji Takagi 2011-05-10
7928378 Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former Toshifumi Kimba, Tohru Satake, Tsutomu Karimata, Nobuharu Noji, Takeshi Murakami +6 more 2011-04-19
7925944 Semiconductor device Masaya Hirose, Takeshi Yamamoto, Kinya Daio 2011-04-12
7888642 Electron beam apparatus and method of manufacturing semiconductor device using the apparatus Mamoru Nakasuji, Nabuharu Noji, Tohru Satake, Masahiro Hatakeyama, Takao Kato +7 more 2011-02-15
7873659 Database management system, database management method and database management program 2011-01-18
7863554 Far ultraviolet with high luminance emitting high-purity hexagonal boron nitride monocrystalline powder and method of manufacturing the same Takashi Taniguchi, Hisao Kanda 2011-01-04