WF

Warren M. Farnworth

Micron: 11 patents #16 of 782Top 3%
RR Round Rock Research: 1 patents #55 of 152Top 40%
📍 Nampa, ID: #2 of 33 inventorsTop 7%
🗺 Idaho: #7 of 944 inventorsTop 1%
Overall (2011): #2,056 of 364,097Top 1%
12
Patents 2011

Issued Patents 2011

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
8053279 Methods and systems for imaging and cutting semiconductor wafers and other semiconductor workpieces Tom A. Muntifering, Paul J. Clawson 2011-11-08
7989022 Methods of processing substrates, electrostatic carriers for retaining substrates for processing, and assemblies comprising electrostatic carriers having substrates electrostatically bonded thereto Dewali Ray, Kyle K. Kirby 2011-08-02
7964971 Flexible column die interconnects and structures including same 2011-06-21
7960829 Support structure for use in thinning semiconductor substrates and for supporting thinned semiconductor substrates Alan G. Wood, David R. Hembree, Sidney B. Rigg, William M. Hiatt, Peter Benson +2 more 2011-06-14
7956443 Through-wafer interconnects for photoimager and memory wafers Salman Akram, Charles M. Watkins, Mark Hiatt, David R. Hembree, James M. Wark +6 more 2011-06-07
7932179 Method for fabricating semiconductor device having backside redistribution layers Steve Oliver 2011-04-26
7923298 Imager die package and methods of packaging an imager die on a temporary carrier Steven Oliver 2011-04-12
7918383 Methods for placing substrates in contact with molten solder Kyle K. Kirby, Salman Akram, Daniel P. Cram, Roy Lange 2011-04-05
7880307 Semiconductor device including through-wafer interconnect structure Alan G. Wood 2011-02-01
7875529 Semiconductor devices Leonard Forbes, Paul A. Farrar, Arup Bhattacharyya, Hussein I. Hanafi 2011-01-25
7871859 Vertical surface mount assembly and methods Larry D. Kinsman, Jerry M. Brooks, Walter L. Moden, Terry R. Lee 2011-01-18
7872332 Interconnect structures for stacked dies, including penetrating structures for through-silicon vias, and associated systems and methods Owen R. Fay, David R. Hembree 2011-01-18