AS

Anthony K. Stamper

IBM: 13 patents #21 of 5,214Top 1%
Infineon Technologies Ag: 2 patents #199 of 1,152Top 20%
📍 Burlington, VT: #2 of 53 inventorsTop 4%
🗺 Vermont: #4 of 502 inventorsTop 1%
Overall (2005): #571 of 245,428Top 1%
13
Patents 2005

Issued Patents 2005

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
6962875 Variable contact method and structure 2005-11-08
6960744 Electrically tunable on-chip resistor James W. Adkisson 2005-11-01
6960519 Interconnect structure improvements Timothy J. Dalton, John A. Fitzsimmons, Jeffrey P. Gambino, Lee M. Nicholson, Andrew H. Simon 2005-11-01
6958540 Dual damascene interconnect structures having different materials for line and via conductors Jeffrey P. Gambino, Edward C. Cooney, III, William T. Motsiff, Michael Lane, Andrew H. Simon 2005-10-25
6939791 Contact capping local interconnect Robert M. Geffken, David V. Horak 2005-09-06
6924555 Specially shaped contact via and integrated circuit therewith John Cronin 2005-08-02
6914320 Bilayer HDP CVD/PE CVD cap in advanced BEOL interconnect structures and method thereof Tze-Chiang Chen, Brett H. Engel, John A. Fitzsimmons, Terence L. Kane, Naftall E. Lustig +5 more 2005-07-05
6888251 Metal spacer in single and dual damascene processing Edward C. Cooney, III, Robert M. Geffken 2005-05-03
6887783 Bilayer HDP CVD/PE CVD cap in advance BEOL interconnect structures and method thereof Tze-Chiang Chen, Brett H. Engel, John A. Fitzsimmons, Terence L. Kane, Naftall E. Lustig +5 more 2005-05-03
6862799 Method for changing an electrical resistance of a resistor Arne Ballantine, Cyril Cabral, Jr., Daniel C. Edelstein 2005-03-08
6858889 Polysilicon capacitor having large capacitance and low resistance James W. Adkisson, John A. Bracchitta, Jed H. Rankin 2005-02-22
6846741 Sacrificial metal spacer damascene process Edward C. Cooney, III, Robert M. Geffken 2005-01-25
6838355 Damascene interconnect structures including etchback for low-k dielectric materials Edward C. Cooney, III, Jeffrey P. Gambino, Timothy J. Dalton, John A. Fitzsimmons, Lee M. Nicholson 2005-01-04