AW

Alan G. Wood

Micron: 32 patents #8 of 829Top 1%
📍 Boise, ID: #4 of 534 inventorsTop 1%
🗺 Idaho: #5 of 989 inventorsTop 1%
Overall (2002): #71 of 266,432Top 1%
32
Patents 2002

Issued Patents 2002

Showing 1–25 of 32 patents

Patent #TitleCo-InventorsDate
6501165 Stackable semiconductor package having conductive layer and insulating layers and method of fabrication Warren M. Farnworth, Mike Brooks 2002-12-31
6498503 Semiconductor test interconnect with variable flexure contacts Salman Akram 2002-12-24
6492738 Apparatus and methods of testing and assembling bumped devices using an anisotropically conductive layer Salman Akram, Warren M. Farnworth 2002-12-10
6492187 Method for automatically positioning electronic die within component packages Warren M. Farnworth, John O. Jacobson, David R. Hembree, James M. Wark, Jennifer L. Folaron +3 more 2002-12-10
6472239 Method for fabricating semiconductor components David R. Hembree 2002-10-29
6469532 Apparatus for forming coaxial silicon interconnects Salman Akram, David R. Hembree 2002-10-22
6465877 Semiconductor package including flex circuit, interconnects and dense array external contacts Warren M. Farnworth, Mike Brooks 2002-10-15
6461881 Stereolithographic method and apparatus for fabricating spacers for semiconductor devices and resulting structures Warren M. Farnworth 2002-10-08
6453377 Computer including optical interconnect, memory unit, and method of assembling a computer Warren M. Farnworth 2002-09-17
6451624 Stackable semiconductor package having conductive layer and insulating layers and method of fabrication Warren M. Farnworth, Mike Brooks 2002-09-17
6427899 Utilize ultrasonic energy to reduce the initial contact forces in known-good-die or permanent contact systems David R. Hembree, Michael E. Hess, John O. Jacobson, Warren M. Farnworth 2002-08-06
6419143 Utilize ultrasonic energy to reduce the initial contact forces in known-good-die or permanent contact systems David R. Hembree, Michael E. Hess, John O. Jacobson, Warren M. Farnworth 2002-07-16
6413102 Center bond flip chip semiconductor carrier and a method of making and using it Tongbi Jiang 2002-07-02
6414506 Interconnect for testing semiconductor dice having raised bond pads Salman Akram, Warren M. Farnworth 2002-07-02
6404063 Die-to-insert permanent connection and method of forming Warren M. Farnworth 2002-06-11
6400172 Semiconductor components having lasered machined conductive vias Salman Akram, Warren M. Farnworth 2002-06-04
6396291 Method for testing semiconductor components Salman Akram, David R. Hembree, Warren M. Farnworth, Derek Gochnour, John O. Jacobson 2002-05-28
6392430 Method of forming coaxial silicon interconnects Salman Akram, David R. Hembree 2002-05-21
6392429 Temporary semiconductor package having dense array external contacts David R. Hembree, Warren M. Farnworth, Salman Akram 2002-05-21
6387714 Die-to-insert permanent connection and method of forming Warren M. Farnworth 2002-05-14
6383825 Method and system for testing semiconductor dice, semiconductor packages and semiconductor wafers Warren M. Farnworth 2002-05-07
6380632 Center bond flip-chip semiconductor device and method of making it Tongbi Jiang 2002-04-30
6368896 Method of wafer level chip scale packaging Warren M. Farnworth, Mike Brooks 2002-04-09
6364196 Method and apparatus for aligning and attaching balls to a substrate Salman Akram, Mike Hess, David R. Hembree 2002-04-02
6362532 Semiconductor device having ball-bonded pads J. Mike Brooks, Kevin G. Duesman 2002-03-26