CW

Cheng-Te Wang

UM United Microelectronics: 14 patents #431 of 4,560Top 10%
AT Airoha Technology: 2 patents #25 of 112Top 25%
CU Changzhou University: 2 patents #53 of 358Top 15%
UC Unlimiter Mfa Co.: 2 patents #9 of 22Top 45%
IN Innolux: 1 patents #643 of 1,038Top 65%
Overall (All Time): #205,521 of 4,157,543Top 5%
21
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11774142 Double-line focusing solar energy collection apparatus Ye Zhu 2023-10-03
11692740 Double point-focusing solar energy collection apparatus Ye Zhu 2023-07-04
11616873 Communication device and output sidetone adjustment method thereof Kuo-Wei KAO, Jian Li, Kuo-Ping Yang 2023-03-28
11451916 Sound adjustment method and sound adjustment device Kuo-Wei KAO, Po-Jui WU, Yu-Chieh Huang, Wei-Lin Chang, Kai-Yuan Hsiao +2 more 2022-09-20
10796708 Method for eliminating sound and electronic device performing the same Kuo-Wei KAO, Po-Jui WU, Jian Li, Kuo-Ping Yang 2020-10-06
10658799 Transmission cable and display system Chih-Yang Hsu, Chien-Hung Chen, Heng-Chang CHANG, Chin-Lung Ting 2020-05-19
10607591 Sound playback device and method for masking interference sound through noise masking signal thereof Kuo-Wei KAO, Yu-Chieh Huang, Wei-Lin Chang, I-Ting Lee, Kuo-Ping Yang 2020-03-31
10474026 Method for correcting bevel corners of a layout pattern Kuei-Hsu Chou, Yung-Feng Cheng, Jing-Yi Lee 2019-11-12
9785046 Pattern verifying method Te-Hsien Hsieh, Ming-Jui Chen, Jing-Yi Lee, Jian-Yuan Ma, Yan-Chun Chen 2017-10-10
9262820 Method and apparatus for integrated circuit design Te-Hsien Hsieh, Ming-Jui Chen, Jing-Yi Lee 2016-02-16
9171898 Method for manufacturing semiconductor layout pattern, method for manufacturing semiconductor device, and semiconductor device Yu-Shiang Yang 2015-10-27
9104833 Mask set for double exposure process and method of using the mask set Hui-Fang Kuo, Ming-Jui Chen, Ting-Cheng Tseng 2015-08-11
9047658 Method of optical proximity correction Te-Hsien Hsieh, Ming-Jui Chen, Ping-I Hsieh, Jing-Yi Lee 2015-06-02
8885917 Mask pattern and correcting method thereof Te-Hsien Hsieh, Ming-Jui Chen, Jing-Yi Lee 2014-11-11
8806391 Method of optical proximity correction according to complexity of mask pattern Te-Hsien Hsieh, Ming-Jui Chen, Shih-Ming Kuo, Jing-Yi Lee 2014-08-12
8778604 Mask set for double exposure process and method of using the mask set Hui-Fang Kuo, Ming-Jui Chen, Ting-Cheng Tseng 2014-07-15
8745547 Method for making photomask layout Shih-Ming Kuo, Ming-Jui Chen, Te-Hsien Hsieh, Jing-Yi Lee 2014-06-03
8701052 Method of optical proximity correction in combination with double patterning technique Hui-Fang Kuo, Ming-Jui Chen 2014-04-15
8627242 Method for making photomask layout Hui-Fang Kuo, Ming-Jui Chen 2014-01-07
8383299 Double patterning mask set and method of forming thereof Te-Hsien Hsieh, Ming-Jui Chen, Shih-Ming Kuo, Ping-I Hsieh, Jing-Yi Lee 2013-02-26
8225237 Method to determine process window Te-Hung Wu, Sheng-Yuan Huang, Chia-Wei Huang, Ping-I Hsieh, Po-I Lee +2 more 2012-07-17