Te-Hung Wu — 11 Patents at United Microelectronics

Te-Hung Wu has been granted 11 US patents while listed as an inventor at United Microelectronics. The first was granted in 2003 and the most recent in November 2012. Te-Hung Wu ranks #435,149 of 4,157,543 US inventors in our database (top 10.5%). Patent records list Te-Hung Wu in Danei, TW.

Patents per Year

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Showing 1–11 of 11 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
8321820	Method to compensate optical proximity correction	Chun-Hsien Huang, Ming-Jui Chen, Yu-Shiang Yang	2012-11-27	$663,000
8321822	Method and computer-readable medium of optical proximity correction	Yu-Shiang Yang, Ming-Jui Chen	2012-11-27	$663,000
8225237	Method to determine process window	Sheng-Yuan Huang, Cheng-Te Wang, Chia-Wei Huang, Ping-I Hsieh, Po-I Lee +2 more	2012-07-17	$922,000
8166424	Method for constructing OPC model	Chuen-Huei Yang	2012-04-24	$1,032,000
8151221	Method to compensate optical proximity correction	Chun-Hsien Huang, Ming-Jui Chen, Yu-Shiang Yang	2012-04-03	$2,065,000
8042069	Method for selectively amending layout patterns	Yu-Shiang Yang, Yung-Feng Cheng, Chuen-Huei Yang, Hsiang-Yun Huang, Hui-Fang Kuo +2 more	2011-10-18	$841,000
7913196	Method of verifying a layout pattern	Chia-Wei Huang, Chuen-Huei Yang, Sheng-Yuan Huang, Pei-Ru Tsai, Chih-Hao Wu	2011-03-22	$1,809,000
7886254	Method for amending layout patterns	Chia-Wei Huang, Pei-Ru Tsai, Ping-I Hsieh	2011-02-08	$1,968,000
7669153	Method for correcting photomask pattern	Chuen-Huei Yang, Sheng-Yuan Huang, Chia-Wei Huang, Pei-Ru Tsai	2010-02-23	$2,094,000
7664614	Method of inspecting photomask defect	Shih-Ming Yen, Chih-Hao Wu, Chuen-Huei Yang	2010-02-16	$1,854,000
6536130	Overlay mark for concurrently monitoring alignment accuracy, focus, leveling and astigmatism and method of application thereof	Jung-Yu Hsieh, Hsiu-Man Chang	2003-03-25	$1,801,000

Te-Hung Wu — 11 Patents

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