| 12513195 |
Secure cross-tenant access |
Sucharit SENGUPTA, Gaurav Dhawan, Prasanna Padmanabhan, Amar Dinesh ZAVERY, Artem Rudoy +4 more |
2025-12-30 |
|
| 11933844 |
Path based controls for ATE mode testing of multicell memory circuit |
Wilson Pradeep |
2024-03-19 |
$26,256,000 |
| 11921159 |
Compressed scan chain diagnosis by internal chain observation, processes, circuits, devices and systems |
Rubin Ajit Parekhji, Arvind Jain, Sundarrajan Subramanian |
2024-03-05 |
$28,640,000 |
| 11879940 |
Dynamic generation of ATPG mode signals for testing multipath memory circuit |
Wilson Pradeep |
2024-01-23 |
$24,621,000 |
| 11852683 |
Scan chain self-testing of lockstep cores on reset |
Nikita Naresh |
2023-12-26 |
$25,539,000 |
| 11821945 |
Full pad coverage boundary scan |
Rajesh Mittal, Rajat Mehrotra |
2023-11-21 |
$37,313,000 |
| 11768726 |
Delay fault testing of pseudo static controls |
Aravinda Acharya, Wilson Pradeep |
2023-09-26 |
$35,904,000 |
| 11709203 |
Transition fault testing of functionally asynchronous paths in an integrated circuit |
Sundarrajan Rangachari, Prashanth Saraf |
2023-07-25 |
$54,322,000 |
| 11592483 |
Compressed scan chain diagnosis by internal chain observation, processes, circuits, devices and systems |
Rubin Ajit Parekhji, Arvind Jain, Sundarrajan Subramanian |
2023-02-28 |
$29,378,000 |
| 11555853 |
Scan chain self-testing of lockstep cores on reset |
Nikita Naresh |
2023-01-17 |
$43,170,000 |
| 11519964 |
Phase controlled codec block scan of a partitioned circuit device |
Wilson Pradeep |
2022-12-06 |
$49,269,000 |
| 11521698 |
Testing read-only memory using memory built-in self-test controller |
Nikita Naresh, Prathyusha Teja Inuganti, Rakesh Channabasappa Yaraduyathinahalli, Aravinda Acharya, Jasbir Singh +1 more |
2022-12-06 |
$49,269,000 |
| 11300615 |
Transistion fault testing of funtionally asynchronous paths in an integrated circuit |
Sundarrajan Rangachari, Prashanth Saraf |
2022-04-12 |
$29,056,000 |
| 11209481 |
Multiple input signature register analysis for digital circuitry |
Naman Maheshwari, Wilson Pradeep |
2021-12-28 |
$39,584,000 |
| 11194645 |
Delay fault testing of pseudo static controls |
Aravinda Acharya, Wilson Pradeep |
2021-12-07 |
$28,643,000 |
| 11194944 |
False path timing exception handler circuit |
Wilson Pradeep, Saket Jalan |
2021-12-07 |
$28,643,000 |
| 11119152 |
Functional circuitry, decompressor circuitry, scan circuitry, masking circuitry, qualification circuitry |
Rubin Ajit Parekhji, Arvind Jain, Sundarrajan Subramanian |
2021-09-14 |
$36,977,000 |
| 11073553 |
Dynamic generation of ATPG mode signals for testing multipath memory circuit |
Wilson Pradeep |
2021-07-27 |
$44,725,000 |
| 11073557 |
Phase controlled codec block scan of a partitioned circuit device |
Wilson Pradeep |
2021-07-27 |
$44,725,000 |
| 11047910 |
Path based controls for ATE mode testing of multicell memory circuit |
Wilson Pradeep |
2021-06-29 |
$28,332,000 |
| 10983161 |
Full pad coverage boundary scan |
Rajesh Mittal, Rajat Mehrotra |
2021-04-20 |
$65,359,000 |
| 10866280 |
Scan chain self-testing of lockstep cores on reset |
Nikita Naresh |
2020-12-15 |
$48,103,000 |
| 10818374 |
Testing read-only memory using memory built-in self-test controller |
Nikita Naresh, Prathyusha Teja Inuganti, Rakesh Channabasappa Yaraduyathinahalli, Aravinda Acharya, Jasbir Singh +1 more |
2020-10-27 |
$50,745,000 |
| 10776546 |
False path timing exception handler circuit |
Wilson Pradeep, Saket Jalan |
2020-09-15 |
$33,314,000 |
| 10591540 |
Compressed scan chains with three input mask gates and registers |
Rubin Ajit Parekhji, Arvind Jain, Sundarrajan Subramanian |
2020-03-17 |
$18,075,000 |