| 11899063 |
Generating multiple pseudo static control signals using on-chip JTAG state machine |
Mudasir Shafat Kawoosa |
2024-02-13 |
| 11821945 |
Full pad coverage boundary scan |
Prakash Narayanan, Rajat Mehrotra |
2023-11-21 |
| 11408936 |
Generating multiple pseudo static control signals using on-chip JTAG state machine |
Mudasir Shafat Kawoosa |
2022-08-09 |
| 10983161 |
Full pad coverage boundary scan |
Prakash Narayanan, Rajat Mehrotra |
2021-04-20 |
| 10877093 |
Non-interleaved scan operation for achieving higher scan throughput in presence of slower scan outputs |
Mudasir Shafat Kawoosa |
2020-12-29 |
| 10832668 |
Dynamic speech processing |
David William Devries |
2020-11-10 |
| 10739402 |
Generating multiple pseudo static control signals using on-chip JTAG state machine |
Mudasir Shafat Kawoosa |
2020-08-11 |
| 10515637 |
Dynamic speech processing |
David William Devries |
2019-12-24 |
| 10274538 |
Full pad coverage boundary scan |
Prakash Narayanan, Rajat Mehrotra |
2019-04-30 |
| 10088525 |
Non-interleaved scan operation for achieving higher scan throughput in presence of slower scan outputs |
Mudasir Shafat Kawoosa |
2018-10-02 |
| 10060979 |
Generating multiple pseudo static control signals using on-chip JTAG state machine |
Mudasir Shafat Kawoosa |
2018-08-28 |
| 9970987 |
Method and apparatus for test time reduction using fractional data packing |
Sreenath Narayanan Potty, Mudasir Shafat Kawoosa, Vivek Singhal |
2018-05-15 |
| 9791505 |
Full pad coverage boundary scan |
Prakash Narayanan, Rajat Mehrotra |
2017-10-17 |
| 9772376 |
Increase data transfer throughput by enabling dynamic JTAG test mode entry and sharing of all JTAG pins |
Mudasir Shafat Kawoosa |
2017-09-26 |
| 9581645 |
Test circuit providing different levels of concurrency among radio cores |
Adesh Sontakke, Rubin Ajit Parekhji, Upendra Narayan Tripathi |
2017-02-28 |
| 9535123 |
Frequency scaled segmented scan chain for integrated circuits |
Wilson Pradeep, Vivek Singhal |
2017-01-03 |
| 9448284 |
Method and apparatus for test time reduction using fractional data packing |
Sreenath Narayanan Potty, Mudasir Shafat Kawoosa, Vivek Singhal |
2016-09-20 |
| 9347991 |
Scan throughput enhancement in scan testing of a device-under-test |
Mudasir Shafat Kawoosa, Sreenath Narayanan Potty |
2016-05-24 |
| 9261560 |
Handling slower scan outputs at optimal frequency |
Mudasir Shafat Kawoosa, Sreenath Narayanan Potty |
2016-02-16 |
| 9239360 |
DFT approach to enable faster scan chain diagnosis |
Charles Kurian, Sumanth Reddy Poddutur |
2016-01-19 |
| 8972807 |
Integrated circuits capable of generating test mode control signals for scan tests |
Puneet Sabbarwal, Prakash Narayanan, Rubin Ajit Parekhji |
2015-03-03 |
| 8694276 |
Built-in self-test methods, circuits and apparatus for concurrent test of RF modules with a dynamically configurable test structure |
Adesh Sontakke, Rubin Ajit Parekhji, Upendra Narayan Tripathi |
2014-04-08 |