Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12298346 | Secured scan access for a device including a scan chain | Pervez GARG, Prateek Giri | 2025-05-13 |
| 11927633 | Secured scan access for a device including a scan chain | Pervez GARG, Prateek Giri | 2024-03-12 |
| 11899063 | Generating multiple pseudo static control signals using on-chip JTAG state machine | Rajesh Mittal | 2024-02-13 |
| 11747399 | Scan test control decoder with storage elements for use within integrated circuit (IC) devices having limited test interface | Vishal Diwan | 2023-09-05 |
| 11408936 | Generating multiple pseudo static control signals using on-chip JTAG state machine | Rajesh Mittal | 2022-08-09 |
| 11402432 | Scan test control decoder with storage elements for use within integrated circuit (IC) devices having limited test interface | Vishal Diwan | 2022-08-02 |
| 10877093 | Non-interleaved scan operation for achieving higher scan throughput in presence of slower scan outputs | Rajesh Mittal | 2020-12-29 |
| 10852353 | Scan test control decoder with storage elements for use within integrated circuit (IC) devices having limited test interface | Vishal Diwan | 2020-12-01 |
| 10746797 | Dynamically protective scan data control | Rubin Ajit Parekhji | 2020-08-18 |
| 10739402 | Generating multiple pseudo static control signals using on-chip JTAG state machine | Rajesh Mittal | 2020-08-11 |
| 10088525 | Non-interleaved scan operation for achieving higher scan throughput in presence of slower scan outputs | Rajesh Mittal | 2018-10-02 |
| 10060979 | Generating multiple pseudo static control signals using on-chip JTAG state machine | Rajesh Mittal | 2018-08-28 |
| 9970987 | Method and apparatus for test time reduction using fractional data packing | Sreenath Narayanan Potty, Rajesh Mittal, Vivek Singhal | 2018-05-15 |
| 9772376 | Increase data transfer throughput by enabling dynamic JTAG test mode entry and sharing of all JTAG pins | Rajesh Mittal | 2017-09-26 |
| 9448284 | Method and apparatus for test time reduction using fractional data packing | Sreenath Narayanan Potty, Rajesh Mittal, Vivek Singhal | 2016-09-20 |
| 9347991 | Scan throughput enhancement in scan testing of a device-under-test | Rajesh Mittal, Sreenath Narayanan Potty | 2016-05-24 |
| 9261560 | Handling slower scan outputs at optimal frequency | Rajesh Mittal, Sreenath Narayanan Potty | 2016-02-16 |