Jais Abraham — 10 Patents at Texas Instruments

Jais Abraham has been granted 10 US patents while listed as an inventor at Texas Instruments. The first was granted in 2005 and the most recent in June 2025. Jais Abraham ranks #481,000 of 4,157,543 US inventors in our database (top 11.6%). Patent records list Jais Abraham in Kanchinakote, IN.

Patents per Year

Issued Patents All Time

Showing 1–10 of 10 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12327599	Memory with scan chain testing of column redundancy logic and multiplexing	Rahul Sahu, Sharad Gupta, Jung Pill Kim, Chulmin Jung	2025-06-10
11935606	Memory with scan chain testing of column redundancy logic and multiplexing	Rahul Sahu, Sharad Gupta, Jung Pill Kim, Chulmin Jung	2024-03-19	$16,702,000
10996267	Time interleaved scan system	Punit Kishore	2021-05-04	$31,958,000
10656203	Low pin count test controller	Punit Kishore, Pawan Chhabra	2020-05-19	$15,648,000
7421634	Sequential scan based techniques to test interface between modules designed to operate at different frequencies	Naga Satya Srikanth Puvvada, Nikila Krishnamoorthy, Sandeep Jain	2008-09-02	$21,598,000
7404126	Scan tests tolerant to indeterminate states when employing signature analysis to analyze test outputs	Sandeep Jain	2008-07-22	$4,786,000
7352169	Testing components of I/O paths of an integrated circuit	Rohit Goel	2008-04-01	$12,635,000
7082558	Increasing possible test patterns which can be used with sequential scanning techniques to perform speed analysis	Ajit Deepak Gupte, Shankaranarayana Karantha Deshamangala, Amit Brahme	2006-07-25	$60,603,000
6981190	Controlling the content of specific desired memory elements when testing integrated circuits using sequential scanning techniques	Ajit Deepak Gupte	2005-12-27	$16,680,000
6853212	Gated scan output flip-flop	G. Subash Chandar	2005-02-08	$25,066,000

Jais Abraham — 10 Patents

Patents per Year

Issued Patents All Time

Patent Widget