NK

Nikila Krishnamoorthy

TI Texas Instruments: 5 patents #2,788 of 12,488Top 25%
NB Nxp B.V.: 4 patents #595 of 3,591Top 20%
FS Freeescale Semiconductor: 1 patents #2,021 of 3,767Top 55%
NU Nxp Usa: 1 patents #1,089 of 2,066Top 55%
Overall (All Time): #430,899 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12196804 System for scan mode exit and methods for scan mode exit Tarun Goyal 2025-01-14
11879939 System and method for testing clocking systems in integrated circuits Abhishek Mahajan, Rishabh Kaistha, Varsha Bansal 2024-01-23
11686769 Signal toggling detection and correction circuit Shikhar Makkar 2023-06-27
11144677 Method and apparatus for digital only secure test mode entry Stefan Doll, Thomas Henry Luedeke, Hubert Glenn Carson, Jr., Anurag Jindal, Hilario Manuel Garza +3 more 2021-10-12
10955473 System and method of scan reset upon entering scan mode Sandeep Jain, Thomas E. Tkacik 2021-03-23
8458541 System and method for debugging scan chains Sandeep Jain, Abhishek Chaudhary, Nipun Mahajan, Saurabh Chauhan 2013-06-04
7421634 Sequential scan based techniques to test interface between modules designed to operate at different frequencies Naga Satya Srikanth Puvvada, Sandeep Jain, Jais Abraham 2008-09-02
7213184 Testing of modules operating with different characteristics of control signals using scan based techniques Anindya Saha, Rubin Ajit Parekhji 2007-05-01
7134061 At-speed ATPG testing and apparatus for SoC designs having multiple clock domain using a VLCT test platform Anupama Aniruddha Agashe, Anindya Saha, Rubin Ajit Parekhji 2006-11-07
7120842 Mechanism to enhance observability of integrated circuit failures during burn-in tests Gordhan Barevadia, Anupama Aniruddha Agashe, Rubin Ajit Parekhji, Neil John Simpson 2006-10-10
6925408 Mixed-signal core design for concurrent testing of mixed-signal, analog, and digital components Amit Premy, Vudutha V. N. Suresh Gupta, Anupama Aniruddha Agashe, Rubin Ajit Parekhji 2005-08-02