Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7134061 | At-speed ATPG testing and apparatus for SoC designs having multiple clock domain using a VLCT test platform | Nikila Krishnamoorthy, Anindya Saha, Rubin Ajit Parekhji | 2006-11-07 |
| 7120842 | Mechanism to enhance observability of integrated circuit failures during burn-in tests | Gordhan Barevadia, Nikila Krishnamoorthy, Rubin Ajit Parekhji, Neil John Simpson | 2006-10-10 |
| 6925408 | Mixed-signal core design for concurrent testing of mixed-signal, analog, and digital components | Amit Premy, Vudutha V. N. Suresh Gupta, Nikila Krishnamoorthy, Rubin Ajit Parekhji | 2005-08-02 |