Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11768240 | Re-programmable self-test | Alan Hales | 2023-09-26 |
| 11092650 | Re-programmable self-test | Alan Hales | 2021-08-17 |
| 10247780 | Re-programmable self-test | Alan Hales | 2019-04-02 |
| 7120842 | Mechanism to enhance observability of integrated circuit failures during burn-in tests | Gordhan Barevadia, Anupama Aniruddha Agashe, Nikila Krishnamoorthy, Rubin Ajit Parekhji | 2006-10-10 |