Issued Patents All Time
Showing 1–25 of 25 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11768240 | Re-programmable self-test | Neil John Simpson | 2023-09-26 |
| 11092650 | Re-programmable self-test | Neil John Simpson | 2021-08-17 |
| 10247780 | Re-programmable self-test | Neil John Simpson | 2019-04-02 |
| 10120025 | Functional core circuitry with serial scan test expected, mask circuitry | Lee D. Whetsel | 2018-11-06 |
| 9829538 | IC expected data and mask data on I/O data pads | Lee D. Whetsel | 2017-11-28 |
| 9702935 | Packet based integrated circuit testing | Lewis Nardini, Sumant Dinkar Kale | 2017-07-11 |
| 9562946 | Integrated circuit wafer having plural dies with each die including test circuit receiving expected data and mask data from different pads | Lee D. Whetsel | 2017-02-07 |
| 9322879 | Integrated circuit wafer having integrated circuit die with plural comparators receiving expected data and mask data from different pads | Lee D. Whetsel | 2016-04-26 |
| 9103885 | Integrated circuit with plural comparators receiving expected data and mask data from different pads | Lee D. Whetsel | 2015-08-11 |
| 8872178 | IC with comparator receiving expected and mask data from pads | Lee D. Whetsel | 2014-10-28 |
| 8692248 | Integrated circuit die having input and output circuit pads, test circuitry, and multiplex circuitry | Lee D. Whetsel | 2014-04-08 |
| 8604475 | IC dies with serarate connections to expected and mask data | Lee D. Whetsel | 2013-12-10 |
| 8525565 | Family of multiplexer/flip-flops with enhanced testability | Mujibur Rahman, Timothy David Anderson | 2013-09-03 |
| 8397112 | Test chain testability in a system for testing tri-state functionality | Mujibur Rahman, Timothy David Anderson | 2013-03-12 |
| 8375265 | Delay fault testing using distributed clock dividers | Ramakrishnan Venkatasubramanian, William Cronin Wallace | 2013-02-12 |
| 8299464 | Comparator receiving expected and mask data from circuit pads | Lee D. Whetsel | 2012-10-30 |
| 8205125 | Enhanced control in scan tests of integrated circuits with partitioned scan chains | Srujan Kumar Nakidi, Rubin Ajit Parekhji, Srivaths Ravi, Rajesh Tiwari | 2012-06-19 |
| 7842949 | IC with comparator receiving expected and mask data from pads | Lee D. Whetsel | 2010-11-30 |
| 7655946 | IC with comparator receiving expected and mask data from pads | Lee D. Whetsel | 2010-02-02 |
| 7491970 | IC with comparator receiving expected and mask data from pads | Lee D. Whetsel | 2009-02-17 |
| 7469372 | Scan sequenced power-on initialization | Lewis Nardini | 2008-12-23 |
| 7389455 | Register file initialization to prevent unknown outputs during test | — | 2008-06-17 |
| 7183570 | IC with comparator receiving expected and mask data from pads | Lee D. Whetsel | 2007-02-27 |
| 7039823 | On-chip reset circuitry and method | Anthony M. Hill | 2006-05-02 |
| 6894308 | IC with comparator receiving expected and mask data from pads | Lee D. Whetsel | 2005-05-17 |