AH

Alan Hales

TI Texas Instruments: 25 patents #433 of 12,488Top 4%
Overall (All Time): #161,991 of 4,157,543Top 4%
25
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11768240 Re-programmable self-test Neil John Simpson 2023-09-26
11092650 Re-programmable self-test Neil John Simpson 2021-08-17
10247780 Re-programmable self-test Neil John Simpson 2019-04-02
10120025 Functional core circuitry with serial scan test expected, mask circuitry Lee D. Whetsel 2018-11-06
9829538 IC expected data and mask data on I/O data pads Lee D. Whetsel 2017-11-28
9702935 Packet based integrated circuit testing Lewis Nardini, Sumant Dinkar Kale 2017-07-11
9562946 Integrated circuit wafer having plural dies with each die including test circuit receiving expected data and mask data from different pads Lee D. Whetsel 2017-02-07
9322879 Integrated circuit wafer having integrated circuit die with plural comparators receiving expected data and mask data from different pads Lee D. Whetsel 2016-04-26
9103885 Integrated circuit with plural comparators receiving expected data and mask data from different pads Lee D. Whetsel 2015-08-11
8872178 IC with comparator receiving expected and mask data from pads Lee D. Whetsel 2014-10-28
8692248 Integrated circuit die having input and output circuit pads, test circuitry, and multiplex circuitry Lee D. Whetsel 2014-04-08
8604475 IC dies with serarate connections to expected and mask data Lee D. Whetsel 2013-12-10
8525565 Family of multiplexer/flip-flops with enhanced testability Mujibur Rahman, Timothy David Anderson 2013-09-03
8397112 Test chain testability in a system for testing tri-state functionality Mujibur Rahman, Timothy David Anderson 2013-03-12
8375265 Delay fault testing using distributed clock dividers Ramakrishnan Venkatasubramanian, William Cronin Wallace 2013-02-12
8299464 Comparator receiving expected and mask data from circuit pads Lee D. Whetsel 2012-10-30
8205125 Enhanced control in scan tests of integrated circuits with partitioned scan chains Srujan Kumar Nakidi, Rubin Ajit Parekhji, Srivaths Ravi, Rajesh Tiwari 2012-06-19
7842949 IC with comparator receiving expected and mask data from pads Lee D. Whetsel 2010-11-30
7655946 IC with comparator receiving expected and mask data from pads Lee D. Whetsel 2010-02-02
7491970 IC with comparator receiving expected and mask data from pads Lee D. Whetsel 2009-02-17
7469372 Scan sequenced power-on initialization Lewis Nardini 2008-12-23
7389455 Register file initialization to prevent unknown outputs during test — 2008-06-17
7183570 IC with comparator receiving expected and mask data from pads Lee D. Whetsel 2007-02-27
7039823 On-chip reset circuitry and method Anthony M. Hill 2006-05-02
6894308 IC with comparator receiving expected and mask data from pads Lee D. Whetsel 2005-05-17