Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Lee D. Whetsel — 867 Patents

TITexas Instruments: 865 patents #1 of 12,488Top 1%
Parker, TX: #1 of 75 inventorsTop 2%
Texas: #1 of 125,132 inventorsTop 1%
Overall (All Time): #86 of 4,157,543Top 1%
867 Patents All Time
Lee D. Whetsel has been granted 867 US patents while listed as an inventor at Texas Instruments. The first was granted in 1989 and the most recent in November 2025. Lee D. Whetsel ranks #86 of 4,157,543 US inventors in our database (top 0.00%). Patent records list Lee D. Whetsel in Parker, TX, US.

Issued Patents All Time

Showing 1–25 of 867 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12467971 Scan testing using scan frames with embedded commands 2025-11-11
12461148 3D stacked die test architecture 2025-11-04
12416670 Falling clock edge JTAG bus routers 2025-09-16
12379393 Testing interposer method and apparatus 2025-08-05
12352814 Interposer circuit 2025-07-08
12313667 Integrated circuit die test architecture 2025-05-27
12210060 Device access port selection 2025-01-28
12188980 Test access port with address and command capability 2025-01-07
12181521 At-speed test access port operations 2024-12-31 $31,735,000
12163998 TSV testing 2024-12-10 $53,437,000
12164001 3D tap and scan port architectures 2024-12-10 $53,437,000
12154835 Scan testable through silicon VIAs 2024-11-26 $43,726,000
12153090 Commanded JTAG test access port operations 2024-11-26 $43,726,000
12146909 Selectable JTAG or trace access with data store and output 2024-11-19 $56,184,000
12130328 Interface to full and reduced pin JTAG devices 2024-10-29 $41,373,000
12117490 Scan frame based test access mechanisms 2024-10-15 $49,304,000
12092687 Selectable JTAG or trace access with data store and output 2024-09-17 $65,071,000
12050247 Addressable test access port 2024-07-30 $47,336,000
12025649 Integrated circuit die test architecture 2024-07-02 $32,959,000
12013434 Programmable test compression architecture input/output shift register coupled to SCI/SCO/PCO 2024-06-18 $58,381,000
12007441 3D stacked die test architecture 2024-06-11 $44,466,000
11965930 Test compression in a JTAG daisy-chain environment 2024-04-23 $78,074,000
11906582 Shadow access port method and apparatus 2024-02-20 $42,955,000
11879941 Scan testing using scan frames with embedded commands 2024-01-23 $24,621,000
11867756 Reduced signaling interface method and apparatus 2024-01-09 $22,697,000