Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8205125 | Enhanced control in scan tests of integrated circuits with partitioned scan chains | Alan Hales, Rubin Ajit Parekhji, Srivaths Ravi, Rajesh Tiwari | 2012-06-19 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8205125 | Enhanced control in scan tests of integrated circuits with partitioned scan chains | Alan Hales, Rubin Ajit Parekhji, Srivaths Ravi, Rajesh Tiwari | 2012-06-19 |