NM

Nipun Mahajan

Bank of America: 5 patents #750 of 5,361Top 15%
FS Freeescale Semiconductor: 4 patents #779 of 3,767Top 25%
NB Nxp B.V.: 1 patents #1,722 of 3,591Top 50%
NU Nxp Usa: 1 patents #1,089 of 2,066Top 55%
📍 Lawrenceville, NJ: #95 of 646 inventorsTop 15%
🗺 New Jersey: #8,044 of 69,400 inventorsTop 15%
Overall (All Time): #436,070 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
12367127 Dynamic response generation based on an anomaly associated with a software application Pravin Kumar Sankari Bhagavathiappan, Amit Mishra, Yogesh Raghuvanshi 2025-07-22
12301761 Intelligent routing signaling system Amit Mishra, Yogesh Raghuvanshi, S. B. Pravin Kumar, Balaji Sugumar, Yaksh Kumar Singh 2025-05-13
12153908 Source code conversion from an original computer programming language to a target programming language Amit Mishra, Yaksh Kumar Singh, Yogesh Raghuvanshi, Pravin Kumar Sankari Bhagavathiappan 2024-11-26
12124828 Source code validation based on converting the source code to a non-programming language Amit Mishra, Yaksh Kumar Singh, Yogesh Raghuvanshi, Pravin Kumar Sankari Bhagavathiappan 2024-10-22
11513153 System and method for facilitating built-in self-test of system-on-chips Rohan Poudel, Anurag Jindal, Joseph Wright, Shruti Singla, Hemant Nautiyal 2022-11-29
11461205 Error management system for system-on-chip Neha Bagri, Abhinav Gaur 2022-10-04
10810273 Auto identification and mapping of functional attributes from visual representation Pinak Chakraborty, Gaurav Bansal, Yogesh Raghuvanshi 2020-10-20
9599673 Structural testing of integrated circuits Anurag Jindal 2017-03-21
9298572 Built-in self test (BIST) with clock control Nisar Ahmed, Anurag Jindal 2016-03-29
8793641 System and method for determining power leakage of electronic circuit design Amit Roy, Shyam S. Gupta, Vijay Tayal, Chetan Verma 2014-07-29
8458541 System and method for debugging scan chains Sandeep Jain, Nikila Krishnamoorthy, Abhishek Chaudhary, Saurabh Chauhan 2013-06-04