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Nisar Ahmed

FS Freeescale Semiconductor: 2 patents #1,335 of 3,767Top 40%
IN Infinera: 2 patents #172 of 407Top 45%
TI Texas Instruments: 2 patents #5,248 of 12,488Top 45%
NU Nxp Usa: 1 patents #1,089 of 2,066Top 55%
UC University Of Southern California: 1 patents #782 of 1,826Top 45%
📍 Bellevue, WA: #1,156 of 6,950 inventorsTop 20%
🗺 Washington: #10,403 of 76,902 inventorsTop 15%
Overall (All Time): #481,261 of 4,157,543Top 15%
10
Patents All Time

Issued Patents All Time

Showing 1–10 of 10 patents

Patent #TitleCo-InventorsDate
12425118 Turn up and express traffic validation for communication systems Jonathan Buset, Francisco Javier Vaquero Caballero, Thomas Gerard, Stephane St-Laurent 2025-09-23
12283991 Method of transient management in optical transmission systems Jonathan Buset, Stephane St. Laurent, Daniel Fonseca, Sanjeev Ramachandran, Ashok Kunjidhapatham +1 more 2025-04-22
9768909 Systems and techniques for orbital angular momentum based reconfigurable switching Hao-Wei Huang, Yang Yue, Moshe J. Willner, Yan Yan, Yongxiong Ren +2 more 2017-09-19
9547043 Test control point insertion and X-bounding for logic built-in self-test (LBIST) using observation circuitry Orman G. Shofner 2017-01-17
9298572 Built-in self test (BIST) with clock control Anurag Jindal, Nipun Mahajan 2016-03-29
9043620 Resolution programmable dynamic IR-drop sensor with peak IR-drop tracking abilities Xiaoxiao Wang, Anis M. Jarrar, Dat T. Tran, LeRoy Winemberg 2015-05-26
8788897 Path-based crosstalk fault test scanning in built-in self-testing Corey Jason Goodrich, Xiao Liu, Chris Therrien 2014-07-22
8478136 Electronic compensation of nonlinearity in optical communication M. Imran Hayee 2013-07-02
8089346 System and method for managing restaurant customers and placing orders Girish Sugurappa Angadi 2012-01-03
7640475 At-speed transition fault testing with low speed scan enable Chennagiri P. Ravikumar 2009-12-29