Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9547043 | Test control point insertion and X-bounding for logic built-in self-test (LBIST) using observation circuitry | Nisar Ahmed | 2017-01-17 |
| 9222971 | Functional path failure monitor | Xiaoxiao Wang, Dat T. Tran, LeRoy Winemberg, Ender Yilmaz | 2015-12-29 |
| 6944806 | Method and apparatus to data log at-speed March C+ memory BIST | Cinda L. Flynn | 2005-09-13 |