Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7949920 | DFT techniques to reduce test time and power for SoCs | Varadarajan R. Devanathan | 2011-05-24 |
| 7640475 | At-speed transition fault testing with low speed scan enable | Nisar Ahmed | 2009-12-29 |