Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Increasing possible test patterns which can be used with sequential scanning techniques to perform speed analysis

Increasing possible test patterns which can be used with sequential scanning techniques to perform speed analysis

US Patent 7082558 · Granted Jul 25, 2006

Estimated economic value: $60,603,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

View dependent three-dimensional morphable models2025
Apparatus and method for efficient motion estimation2025
Head mounted display (HMD) device calibration based on hinge motion2025
Facial texture synthesis for three-dimensional morphable models2025
Memory with scan chain testing of column redundancy logic and multiplexing2025
Keypoint detection and feature descriptor computation2025
Methods and systems for chroma residual data prediction2025
User authentication based on three-dimensional face modeling using partial face 2024
Content positioning in extended reality systems2024
Low complexity large transform2024
Memory with scan chain testing of column redundancy logic and multiplexing2024
Apparatus and method for efficient motion estimation2023