SD

Shankaranarayana Karantha Deshamangala

TI Texas Instruments: 1 patents #7,357 of 12,488Top 60%
📍 Ron, IN: #3 of 4 inventorsTop 75%
Overall (All Time): #3,423,832 of 4,157,543Top 85%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7082558 Increasing possible test patterns which can be used with sequential scanning techniques to perform speed analysis Ajit Deepak Gupte, Amit Brahme, Jais Abraham 2006-07-25