Issued Patents All Time
Showing 26–50 of 66 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10714576 | Semiconductor device and method for manufacturing the same | Chi-Cheng Hung, Kei-Wei Chen, Ming-Ching CHUNG, Chia-Yang Wu | 2020-07-14 |
| 10522650 | Semiconductor device and methods of manufacture | Chi-Cheng Hung, Chia-Ching Lee, Ching-Hwanq Su | 2019-12-31 |
| 10516034 | Semiconductor device and methods of manufacture | Chi-Cheng Hung, Chia-Ching Lee, Ching-Hwanq Su | 2019-12-24 |
| 10510851 | Low resistance contact method and structure | Yu-Ting Lin | 2019-12-17 |
| 10497811 | FinFET structures and methods of forming the same | Chi-Cheng Hung, Chia-Ching Lee, Chung-Chiang Wu, Ching-Hwanq Su | 2019-12-03 |
| 10497615 | Semiconductor device and method | Chi-Cheng Hung, Ching-Hwanq Su, Liang-Yueh Ou Yang, Ming-Hsing Tsai, Yu-Ting Lin | 2019-12-03 |
| 10483165 | Methods for forming contact plugs with reduced corrosion | Chi-Cheng Hung, Chen-Yuan Kao, Yi-Wei Chiu, Liang-Yueh Ou Yang, Yueh-Ching Pai | 2019-11-19 |
| 10352982 | Testing system and testing circuit thereof | Hong-Lun Wang, Cheng-Yang Su | 2019-07-16 |
| 10269926 | Purging deposition tools to reduce oxygen and moisture in wafers | Yi-Ying Liu, Chun-Wen Nieh, Yu-Ting Lin, Wei-Yu Chen | 2019-04-23 |
| 10191207 | Light emitting module and electronic device with the same | Ho-Jui Kao | 2019-01-29 |
| 10186456 | Methods for forming contact plugs with reduced corrosion | Chi-Cheng Hung, Chen-Yuan Kao, Yi-Wei Chiu, Liang-Yueh Ou Yang, Yueh-Ching Pai | 2019-01-22 |
| 10157785 | Semiconductor device and method | Chi-Cheng Hung, Ching-Hwanq Su, Liang-Yueh Ou Yang, Ming-Hsing Tsai, Yu-Ting Lin | 2018-12-18 |
| 10157998 | Semiconductor device and manufacturing method thereof | Chi-Cheng Hung, Da-Yuan Lee, Hsin-Yi Lee, Kuan-Ting Liu | 2018-12-18 |
| 10153203 | Methods for forming metal layers in openings and apparatus for forming same | Yu-Ting Lin, Hung-Chang Hsu, Hsiao-Ping Liu, Hung Pin Lu, Yuan Wen Lin | 2018-12-11 |
| 10147799 | Method of fabricating tantalum nitride barrier layer and semiconductor device thereof | Chi-Cheng Hung, Weng-Cheng Chen, Hao Wei, Ming-Ching CHUNG, Chi-Cherng Jeng | 2018-12-04 |
| 9991362 | Semiconductor device including tungsten gate and manufacturing method thereof | Chi-Cheng Hung, Chia-Ching Lee, Chung-Chiang Wu | 2018-06-05 |
| 9991124 | Metal gate and manufacturing method thereof | Chi-Cheng Hung, Ting-Siang Su, Ching-Hwanq Su | 2018-06-05 |
| 9947753 | Semiconductor structure and manufacturing method thereof | Chi-Cheng Hung, Kei-Wei Chen, Ming-Ching CHUNG, Chia-Yang Wu | 2018-04-17 |
| 9870995 | Formation of copper layer structure with self anneal strain improvement | Jun-Nan Nian, Shiu-Ko JangJian, Chi-Cheng Hung, Hung-Hsu Chen | 2018-01-16 |
| 9837507 | Semiconductor device and manufacturing method thereof | Chi-Cheng Hung, Da-Yuan Lee, Hsin-Yi Lee, Kuan-Ting Liu | 2017-12-05 |
| 9735231 | Block layer in the metal gate of MOS devices | Jung-Chih Tsao, Chi-Cheng Hung, Wen-Hsi Lee, Kei-Wei Chen, Ying-Lang Wang | 2017-08-15 |
| 9520477 | Semiconductor device and fabricating method thereof | Chi-Cheng Hung, Kei-Wei Chen, Ying-Lang Wang | 2016-12-13 |
| 9502290 | Oxidation-free copper metallization process using in-situ baking | Shih-Ho Lin, Kei-Wei Chen, Szu-An Wu, Ying-Lang Wang | 2016-11-22 |
| 9449922 | Contact critical dimension control | Tain-Shang Chang, Chia-Han Lai, Ren-Hau Yu, Ching-Yao Sun | 2016-09-20 |
| 9396953 | Conformity control for metal gate stack | Chi-Cheng Hung, Kuan-Ting Liu, Ching-Hwanq Su | 2016-07-19 |