Issued Patents All Time
Showing 1–25 of 40 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12142628 | Method of forming semiconductor device | Chi-Ming Lu, Chih-Hui Huang, Sheng-Chan Li, Yao-Hsiang Liang | 2024-11-12 |
| 12051617 | Method of making a semiconductor device and semiconductor device | Min Han HSU, Chun-Chang Chen | 2024-07-30 |
| 11854980 | Method for forming titanium nitride barrier with small surface grains in interconnects | Chi-Ming Lu, Yao-Hsiang Liang, Chih-Chang Huang, Han-Chieh Huang | 2023-12-26 |
| 11769669 | Replacement metal gate device structure and method of manufacturing same | Min Han HSU | 2023-09-26 |
| 11450557 | Poisoned metal layer with sloped sidewall for making dual damascene interconnect | Min Han HSU, Chun-Chang Chen | 2022-09-20 |
| 11417700 | Image sensing device and manufacturing method thereof | Chih-Chang Huang, Chi-Ming Lu, Jian Chen, Yao-Hsiang Liang | 2022-08-16 |
| 11404470 | Method of forming deep trench isolation in radiation sensing substrate and image sensor device | Chi-Ming Lu, Chih-Hui Huang, Yao-Hsiang Liang, Chih-Chang Huang, Ching-Ho Hsu | 2022-08-02 |
| 11387274 | Method of forming semiconductor device | Chi-Ming Lu, Chih-Hui Huang, Sheng-Chan Li, Yao-Hsiang Liang | 2022-07-12 |
| 10867889 | Method of manufacturing semiconductor structure | Li-Yen Fang, Chih-Chang Huang, Yao-Hsiang Liang, Yu-Ku Lin | 2020-12-15 |
| 10840330 | Block layer in the metal gate of MOS devices | Chi-Cheng Hung, Yu-Sheng Wang, Wen-Hsi Lee, Kei-Wei Chen, Ying-Lang Wang | 2020-11-17 |
| 10796996 | Semiconductor device and method of forming the same | Chi-Ming Lu, Yao-Hsiang Liang, Chih-Chang Huang, Han-Chieh Huang | 2020-10-06 |
| 10741601 | Image sensing device and manufacturing method thereof | Chih-Chang Huang, Chi-Ming Lu, Jian Chen, Yao-Hsiang Liang | 2020-08-11 |
| 10510798 | Method of forming deep trench isolation in radiation sensing substrate and image sensor device | Chi-Ming Lu, Chih-Hui Huang, Yao-Hsiang Liang, Chih-Chang Huang, Ching-Ho Hsu | 2019-12-17 |
| 10475847 | Semiconductor device having stress-neutralized film stack and method of fabricating same | Chi-Ming Lu, Chih-Hui Huang, Sheng-Chan Li, Yao-Hsiang Liang | 2019-11-12 |
| 10157953 | Image sensing device and manufacturing method thereof | Chih-Chang Huang, Chi-Ming Lu, Jian Chen, Yao-Hsiang Liang | 2018-12-18 |
| 10134801 | Method of forming deep trench isolation in radiation sensing substrate and image sensor device | Chi-Ming Lu, Chih-Hui Huang, Yao-Hsiang Liang, Chih-Chang Huang, Ching-Ho Hsu | 2018-11-20 |
| 10074594 | Semiconductor structure and manufacturing method thereof | Li-Yen Fang, Chih-Chang Huang, Yao-Hsiang Liang, Yu-Ku Lin | 2018-09-11 |
| 9991204 | Through via structure for step coverage improvement | Li-Yen Fang, Yao-Hsiang Liang, Yu-Ku Lin | 2018-06-05 |
| 9859124 | Method of manufacturing semiconductor device with recess | Li-Yen Fang, Yao-Hsiang Liang, Yu-Ku Lin | 2018-01-02 |
| 9847296 | Barrier layer and structure method | Chih-Chung Chang, Chun Che Lin, Yu-Ming Huang, Tain-Shang Chang, Jian-Shin Tsai | 2017-12-19 |
| 9735231 | Block layer in the metal gate of MOS devices | Chi-Cheng Hung, Yu-Sheng Wang, Wen-Hsi Lee, Kei-Wei Chen, Ying-Lang Wang | 2017-08-15 |
| 9711454 | Through via structure for step coverage improvement | Li-Yen Fang, Yao-Hsiang Liang, Yu-Ku Lin | 2017-07-18 |
| 9691804 | Image sensing device and manufacturing method thereof | Chih-Chang Huang, Chi-Ming Lu, Jian Chen, Yao-Hsiang Liang | 2017-06-27 |
| 8552529 | Semiconductor device | Yu-Sheng Wang, Kei-Wei Chen, Ying-Lang Wang | 2013-10-08 |
| 8531036 | Via/contact and damascene structures | Shih-Chieh Chang, Ying-Lang Wang, Kei-Wei Chen, Yu-Sheng Wang | 2013-09-10 |