Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10546792 | Method for manufacturing a semiconductor product wafer | Sheng-Che Lin | 2020-01-28 |
| 10410735 | Direct access memory characterization vehicle | Chao-Hsiung Lin, Sheng-Che Lin, Shihpin Kuo, Tzupin Shen, Chia-Chi Lin +1 more | 2019-09-10 |
| 10380305 | Direct probing characterization vehicle for transistor, capacitor and resistor testing | Sheng-Che Lin, Chia-Chi Lin, Hans Eisenmann, Cho-Si Huang, Tzupin Shen +2 more | 2019-08-13 |
| 10096378 | On-chip capacitance measurement for memory characterization vehicle | Chao-Hsiung Lin, Sheng-Che Lin, Shihpin Kuo, Tzupin Shen, Chia-Chi Lin +1 more | 2018-10-09 |
| 9847264 | Method for manufacturing a semiconductor product wafer | Sheng-Che Lin | 2017-12-19 |
| 8115500 | Accurate capacitance measurement for ultra large scale integrated circuits | Keh-Jeng Chang, Yuh-Jier Mii, Sally Liu, Lien Jung Hung, Victor Chih Yuan Chang | 2012-02-14 |
| 8037575 | Method for shape and timing equivalent dimension extraction | Ying-Chou Cheng, Chih-Ming Lai, Ru-Gun Liu, Tsong-Hua Ou, Min-Hong Wu +4 more | 2011-10-18 |
| 7880494 | Accurate capacitance measurement for ultra large scale integrated circuits | Keh-Jeng Chang, Yuh-Jier Mii, Sally Liu, Lien Jung Hung, Victor Chih Yuan Chang | 2011-02-01 |
| 7825678 | Test pad design for reducing the effect of contact resistances | Tseng Chin Lo, Chien-Chang Lee, Chih-Chieh Shao | 2010-11-02 |
| 7783999 | Electrical parameter extraction for integrated circuit design | Tsong-Hua Ou, Ying-Chou Cheng, Chia-Chi Lin, Ru-Gun Liu, Chih-Ming Lai +3 more | 2010-08-24 |
| 7772868 | Accurate capacitance measurement for ultra large scale integrated circuits | Keh-Jeng Chang, Yuh-Jier Mii, Sally Liu, Lien Jung Hung, Victor Chih Yuan Chang | 2010-08-10 |
| 7405585 | Versatile semiconductor test structure array | — | 2008-07-29 |
| 6577149 | Method and device for addressable failure site test structure | Jye-Yen Cheng, Ching-Hsiang Hsu Charles | 2003-06-10 |
| 6576894 | Structure for FIB based microanalysis and method for manufacturing it | — | 2003-06-10 |
| 6396751 | Semiconductor device comprising a test structure | Tsu-bin Shen, Sung-Chun Hsieh, Chien-Jung Wang | 2002-05-28 |
| 6150235 | Method of forming shallow trench isolation structures | Sung-Chun Hsieh, Tsu-bin Shen, Ching-Hsiang Hsu | 2000-11-21 |
| 5940678 | Method of forming precisely cross-sectioned electron-transparent samples | Yong-Fen Hsieh | 1999-08-17 |
| 5926688 | Method of removing thin film layers of a semiconductor component | Chien-Hsin Lee | 1999-07-20 |
| 5747803 | Method for preventing charging effect and thermal damage in charged-particle microscopy | — | 1998-05-05 |