WL

Wen-Long Lee

TSMC: 14 patents #2,167 of 12,232Top 20%
Overall (All Time): #339,060 of 4,157,543Top 9%
14
Patents All Time

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDate
12020905 Method of using high density plasma chemical vapor deposition chamber Wei Wu, Ding-I Liu 2024-06-25
11342164 High density plasma chemical vapor deposition chamber and method of using Wei Wu, Ding-I Liu 2022-05-24
10910199 Method of controlling an adjustable nozzle and method of making a semiconductor device Wei Wu, Ding-I Liu 2021-02-02
9941100 Adjustable nozzle for plasma deposition and a method of controlling the adjustable nozzle Wei Wu, Ding-I Liu 2018-04-10
9859137 Substrate heat treatment apparatus and heat treatment method Chun-Cha Kuo, Tzu-Chien Cheng, Ding-I Liu 2018-01-02
9716044 Interlayer dielectric structure with high aspect ratio process (HARP) Jen-Chi Chang, Chun-Li Lin, Kai-Shiung Hsu, Ming-Shiou Kuo, Po-Hsiung Leu +1 more 2017-07-25
9349733 Gate structure having spacer with flat top surface and method for forming the same Jen-Chi Chang 2016-05-24
9048185 Profile pre-shaping for replacement poly gate interlayer dielectric Chih-Wei Chiang, Kuang-Cheng Wu, Po-Hsiung Leu, Ding-I Liu 2015-06-02
8803249 Profile pre-shaping for replacement poly gate interlayer dielectric Chih-Wei Chiang, Kuang-Cheng Wu, Po-Hsiung Leu, Ding-I Liu 2014-08-12
7851358 Low temperature method for minimizing copper hillock defects Jun Wu, Chyi-Tsong Ni, Shih-Chi Lin 2010-12-14
7635651 Method of smoothening dielectric layer Jun Wu, Shih-Chi Lin, Chyi-Tsong Ni 2009-12-22
7611589 Methods of spin-on wafer cleaning Jun Wu, Dong Lu, Shih-Chi Lin, Yi-An Jian, Guang-Cheng Wang +4 more 2009-11-03
7368383 Hillock reduction in copper films Shih-Chi Lin, Francis Wang, Sez-An Wu 2008-05-06
6585826 Semiconductor wafer cleaning method to remove residual contamination including metal nitride particles Yali Tai, Shih-Chi Lin, Francis Wang, Szu-An Wu, Hsi-Kuei Cheng +1 more 2003-07-01