Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12406130 | Geometric mask rule check with favorable and unfavorable zones | Shih-Ming Chang, Shinn-Sheng Yu, Jue-Chin Yu | 2025-09-02 |
| 12159092 | Method for coloring circuit layout and system for performing the same | Chia-Ping Chiang, Ming-Hui Chih, Chih-Wei Hsu, Ya-Ting Chang, Tsung-Yu Wang +5 more | 2024-12-03 |
| 12019974 | Geometric mask rule check with favorable and unfavorable zones | Shih-Ming Chang, Shinn-Sheng Yu, Jue-Chin Yu | 2024-06-25 |
| 11790145 | Method for coloring circuit layout and system for performing the same | Chia-Ping Chiang, Ming-Hui Chih, Chih-Wei Hsu, Ya-Ting Chang, Tsung-Yu Wang +5 more | 2023-10-17 |
| 11714951 | Geometric mask rule check with favorable and unfavorable zones | Shih-Ming Chang, Shinn-Sheng Yu, Jue-Chin Yu | 2023-08-01 |
| 11392742 | Method for coloring circuit layout and system for performing the same | Chia-Ping Chiang, Ming-Hui Chih, Chih-Wei Hsu, Ya-Ting Chang, Tsung-Yu Wang +5 more | 2022-07-19 |
| 10860774 | Methodology for pattern density optimization | Hung-Chun Wang, Ming-Hui Chih, Chun-Hung Wu, Wen-Hao Liu, Cheng-Hsuan Huang +3 more | 2020-12-08 |
| 10796055 | Method for coloring circuit layout and system for performing the same | Chia-Ping Chiang, Ming-Hui Chih, Chih-Wei Hsu, Ya-Ting Chang, Tsung-Yu Wang +5 more | 2020-10-06 |
| 10747938 | Method for integrated circuit manufacturing | Hung-Chun Wang, Ching-Hsu Chang, Chun-Hung Wu, Cheng Kun Tsai, Feng-Ju Chang +5 more | 2020-08-18 |
| 10509881 | Method for coloring circuit layout and system for performing the same | Chia-Ping Chiang, Ming-Hui Chih, Chih-Wei Hsu, Ya-Ting Chang, Tsung-Yu Wang +5 more | 2019-12-17 |
| 10360339 | Method for integrated circuit manufacturing | Hung-Chun Wang, Ching-Hsu Chang, Chun-Hung Wu, Cheng Kun Tsai, Feng-Ju Chang +5 more | 2019-07-23 |
| 10161856 | Magneto-optical bio-detection devices having high sensitivity | — | 2018-12-25 |
| 10049178 | Methodology for pattern density optimization | Hung-Chun Wang, Ming-Hui Chih, Chun-Hung Wu, Wen-Hao Liu, Cheng-Hsuan Huang +3 more | 2018-08-14 |
| 9411924 | Methodology for pattern density optimization | Hung-Chun Wang, Ming-Hui Chih, Chun-Hung Wu, Wen-Hao Liu, Cheng-Hsuan Huang +3 more | 2016-08-09 |
| 9280041 | Cross quadrupole double lithography method using two complementary apertures | Hsien-Cheng Wang, Hung-Chang Hsieh, Shih-Che Wang, Wen-Chun Huang, Ming-Chang Wen | 2016-03-08 |
| 9262578 | Method for integrated circuit manufacturing | Hung-Chun Wang, Ching-Hsu Chang, Feng-Ju Chang, Chun-Hung Wu, Wen-Hao Liu +5 more | 2016-02-16 |
| 9189587 | Chip level critical point analysis with manufacturer specific data | I-Chang Shih, Jen-Chieh Lo, Tzu-Chin Lin, Ying-Chou Cheng, Chih-Ming Lai +1 more | 2015-11-17 |
| 9165095 | Target point generation for optical proximity correction | Ming-Hui Chih, Wen-Li Cheng, Yu-Po Tang, Chia-Ping Chiang, Yong-Cheng Lin +2 more | 2015-10-20 |
| 9026955 | Methodology for pattern correction | Hung-Chun Wang, Ming-Hui Chih, Chun-Hung Wu, Feng-Ju Chang, Cheng Kun Tsai +2 more | 2015-05-05 |
| 8954899 | Contour alignment system | Tzu-Chin Lin, Hung-Ting Lu, Wen-Chun Huang, Ru-Gun Liu | 2015-02-10 |
| 8681326 | Method and apparatus for monitoring mask process impact on lithography performance | Chien-Hsun Chen, Ru-Gun Liu, Wen-Chun Huang, Chih-Ming Lai, Boren Luo | 2014-03-25 |
| 8477299 | Method and apparatus for monitoring mask process impact on lithography performance | Chien-Hsun Chen, Ru-Gun Liu, Wen-Chun Huang, Chih-Ming Lai, Boren Luo | 2013-07-02 |
| 8416393 | Cross quadrupole double lithography method and apparatus for semiconductor device fabrication using two apertures | Hsien-Cheng Wang, Hung-Chang Hsieh, Shih-Che Wang, Wen-Chun Huang, Ming-Chang Wen | 2013-04-09 |