Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11353324 | Method for validating measurement data | Chui-Jung Chiu, Ying-Chou Cheng, Ru-Gun Liu | 2022-06-07 |
| 10520303 | Method for validating measurement data | Chui-Jung Chiu, Ying-Chou Cheng, Ru-Gun Liu | 2019-12-31 |
| 9823066 | Method for validating measurement data | Chui-Jung Chiu, Ying-Chou Cheng, Ru-Gun Liu | 2017-11-21 |
| 9404743 | Method for validating measurement data | Chui-Jung Chiu, Ying-Chou Cheng, Ru-Gun Liu | 2016-08-02 |
| 9330956 | Method for manufacturing semiconductor device | Chao-Ming Cheng | 2016-05-03 |
| 9189587 | Chip level critical point analysis with manufacturer specific data | I-Chang Shih, Tzu-Chin Lin, Ping-Chieh Wu, Ying-Chou Cheng, Chih-Ming Lai +1 more | 2015-11-17 |
| 8938206 | Receiving device and method thereof | Yi-Cheng Chen, Chia-Ta Lai | 2015-01-20 |
| 8806392 | Distinguishable IC patterns with encoded information | Shih-Ming Chang, Tzu-Chin Lin, Yu-Po Tang, Tsong-Hua Ou | 2014-08-12 |
| 8442463 | Receiving device and method thereof | Yi-Cheng Chen, Chia-Ta Lai | 2013-05-14 |