Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11308256 | Method of post optical proximity correction (OPC) printing verification by machine learning | Hung-Chun Wang, Wen-Chun Huang, Wei-Chen Chien, Chi-Ping Liu | 2022-04-19 |
| 11048161 | Optical proximity correction methodology using pattern classification for target placement | Hung-Chun Wang, Chi-Ping Liu, Feng-Ju Chang, Ching-Hsu Chang, Wen-Hao Liu +5 more | 2021-06-29 |
| 10860774 | Methodology for pattern density optimization | Hung-Chun Wang, Ming-Hui Chih, Ping-Chieh Wu, Chun-Hung Wu, Wen-Hao Liu +3 more | 2020-12-08 |
| 10747938 | Method for integrated circuit manufacturing | Hung-Chun Wang, Ching-Hsu Chang, Chun-Hung Wu, Feng-Ju Chang, Feng-Lung Lin +5 more | 2020-08-18 |
| 10691864 | Method of post optical proximity correction (OPC) printing verification by machine learning | Hung-Chun Wang, Wen-Chun Huang, Wei-Chen Chien, Chi-Ping Liu | 2020-06-23 |
| 10527928 | Optical proximity correction methodology using pattern classification for target placement | Hung-Chun Wang, Chi-Ping Liu, Feng-Ju Chang, Ching-Hsu Chang, Wen-Hao Liu +5 more | 2020-01-07 |
| 10520829 | Optical proximity correction methodology using underlying layer information | Hung-Chun Wang, Chi-Ping Liu, Wei-Chen Chien, Wen-Chun Huang | 2019-12-31 |
| 10360339 | Method for integrated circuit manufacturing | Hung-Chun Wang, Ching-Hsu Chang, Chun-Hung Wu, Feng-Ju Chang, Feng-Lung Lin +5 more | 2019-07-23 |
| 10049178 | Methodology for pattern density optimization | Hung-Chun Wang, Ming-Hui Chih, Ping-Chieh Wu, Chun-Hung Wu, Wen-Hao Liu +3 more | 2018-08-14 |
| 9418191 | Providing electron beam proximity effect correction by simulating write operations of polygonal shapes | Hung-Chun Wang, Jeng-Horng Chen, Shy-Jay Lin, Chia-Ping Chiang, Wen-Chun Huang +1 more | 2016-08-16 |
| 9411924 | Methodology for pattern density optimization | Hung-Chun Wang, Ming-Hui Chih, Ping-Chieh Wu, Chun-Hung Wu, Wen-Hao Liu +3 more | 2016-08-09 |
| 9390217 | Methodology of optical proximity correction optimization | Hung-Chun Wang, Ming-Hui Chih, Yu-Po Tang, Chia-Ping Chiang, Feng-Ju Chang +2 more | 2016-07-12 |
| 9262578 | Method for integrated circuit manufacturing | Hung-Chun Wang, Ching-Hsu Chang, Feng-Ju Chang, Chun-Hung Wu, Ping-Chieh Wu +5 more | 2016-02-16 |
| 9026955 | Methodology for pattern correction | Hung-Chun Wang, Ming-Hui Chih, Ping-Chieh Wu, Chun-Hung Wu, Feng-Ju Chang +2 more | 2015-05-05 |
| 8683392 | Double patterning methodology | Ken-Hsien Hsieh, Huang-Yu Chen, Jhih-Jian Wang, Tsong-Hua Ou, Wen-Chun Huang +1 more | 2014-03-25 |
| 8631360 | Methodology of optical proximity correction optimization | Hung-Chun Wang, Ming-Hui Chih, Yu-Po Tang, Chia-Ping Chiang, Feng-Ju Chang +2 more | 2014-01-14 |
| 8627241 | Pattern correction with location effect | Hung-Chun Wang, Ming-Hui Chih, Wen-Chun Huang, Ru-Gun Liu | 2014-01-07 |
| 8527916 | Dissection splitting with optical proximity correction to reduce corner rounding | Chia-Ping Chiang, Tsong-Hua Ou, Yu-Po Tang, Ming-Hui Chih, Wen-Li Cheng +2 more | 2013-09-03 |
| 8499261 | Method and apparatus of patterning semiconductor device | Ming-Hui Chih, Wen-Chun Huang, Ru-Gun Liu, Chii-Ping Chen, Jiing-Feng Yang | 2013-07-30 |
| 8464186 | Providing electron beam proximity effect correction by simulating write operations of polygonal shapes | Hung-Chun Wang, Jeng-Horng Chen, Shy-Jay Lin, Chia-Ping Chiang, Wen-Chun Huang +1 more | 2013-06-11 |
| 8381153 | Dissection splitting with optical proximity correction and mask rule check enforcement | Chia-Ping Chiang, Yu-Po Tang, Ming-Hui Chih, Wei-Long Wang, Wen-Chun Huang +7 more | 2013-02-19 |
| 8372742 | Method, system, and apparatus for adjusting local and global pattern density of an integrated circuit design | Ying-Chou Cheng, Cheng-Lung Tsai, Tsong-Hua Ou, Ru-Gun Liu, Wen-Chun Huang | 2013-02-12 |
| 8196072 | Method and apparatus of patterning semiconductor device | Ming-Hui Chih, Wen-Chun Huang, Ru-Gun Liu, Chii-Ping Chen, Jiing-Feng Yang | 2012-06-05 |