HF

Hsien-Ping Feng

TSMC: 11 patents #2,595 of 12,232Top 25%
MIT: 1 patents #4,386 of 9,367Top 50%
TC Trustees Of Boston College: 1 patents #73 of 173Top 45%
📍 Sanwan, MA: #1 of 1 inventorsTop 100%
Overall (All Time): #422,861 of 4,157,543Top 15%
12
Patents All Time

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
8580100 Metal deposition using seed layers Gang Chen, Yu Bo, Zhifeng Ren, Shuo Chen, Bed Poudel 2013-11-12
7667835 Apparatus and method for preventing copper peeling in ECP Hsi-Kuei Cheng, Jung-Chih Tsao, Ming-Yuan Cheng, Steven Lin, Ray Chuang 2010-02-23
7528478 Semiconductor devices having post passivation interconnections and a buffer layer Hsi-Kuei Cheng, Hung-Ju Chien, Hsun-Chang Chan, Chu-Chang Chen, Ying-Lang Wang +2 more 2009-05-05
7481910 Method and apparatus for stabilizing plating film impurities Ming-Yuang Cheng, Si Cheng, Steven Lin, Jung-Chih Tsao, Chen-Peng Fan +1 more 2009-01-27
7432192 Post ECP multi-step anneal/H2 treatment to reduce film impurity Jung-Chih Tsao, Hsi-Kuei Cheng, Chih-Tsung Lee, Ming-Yuan Cheng, Steven Lin +2 more 2008-10-07
7262067 Method for conductive film quality evaluation Min-Yuan Cheng, Hsi-Kuei Cheng, Steven Lin, Huang-Yi Huang, Yuh-Da Fan 2007-08-28
7256120 Method to eliminate plating copper defect Jung-Chin Tsao, Chi-Wen Liu, Hsi-Kuei Cheng, Steven Lin, Min-Yuan Cheng 2007-08-14
7189650 Method and apparatus for copper film quality enhancement with two-step deposition Chi-Wen Liu, Jung-Chih Tsao 2007-03-13
7122471 Method for preventing voids in metal interconnects Jung-Chih Tsao, Chi-Wen Liu, Si-Kua Cheng, Che-Tsao Wang, Steven Lin +1 more 2006-10-17
7030016 Post ECP multi-step anneal/H2 treatment to reduce film impurity Jung-Chih Tsao, Hsi-Kuei Cheng, Chih-Tsung Lee, Ming-Yuan Cheng, Steven Lin +2 more 2006-04-18
7026233 Method for reducing defects in post passivation interconnect process Hsi-Kuei Cheng, Hung-Ju Chien, Hsun-Chang Chan, Chu-Chang Chen, Ying-Lang Wang +2 more 2006-04-11
6985222 Chamber leakage detection by measurement of reflectivity of oxidized thin film Hsi-Kuei Cheng, Chu-Chang Chen, Ting-Chun Wang, Szu-An Wu, Ying-Lang Wang 2006-01-10