HC

Harry Chuang

TSMC: 22 patents #1,516 of 12,232Top 15%
📍 Zhubeikou, TX: #3 of 4 inventorsTop 75%
Overall (All Time): #189,259 of 4,157,543Top 5%
22
Patents All Time

Issued Patents All Time

Showing 1–22 of 22 patents

Patent #TitleCo-InventorsDate
12381158 Wafer bonding method and bonded device structure Yuan-Jen Lee, Nuo Xu, Fang-Lan Chu, Wei-Cheng Wu 2025-08-05
12278166 High bandwidth package structure Wen-Tuo Huang, Wei-Cheng Wu, Yu-Ling Hsu, Pai Chi Chou, Ya-Chi Hung 2025-04-15
8487382 Device scheme of HKMG gate-last process Sheng-Chen Chung, Kong-Beng Thei 2013-07-16
8174091 Fuse structure Kong-Beng Thei, Chung Long Cheng, Chung-Shi Liu, Shien-Yang Wu, Shi-Bai Chen 2012-05-08
8138554 Semiconductor device with local interconnects Kong-Beng Thei, Sheng-Chen Chung, Mong-Song Liang 2012-03-20
8115271 Reducing device performance drift caused by large spacings between active regions Kong-Beng Thei, Mong-Song Liang 2012-02-14
7833848 Method for removing hard masks on gates in semiconductor manufacturing process Hung-Chih Tsai, Chih-Chieh Chen, Sheng-Chen Chung, Kong-Beng Thei 2010-11-16
7812379 SOI devices Chung Long Cheng, Kong-Beng Thei, Sheng-Chen Chung, Tzung-Chi Lee 2010-10-12
7803674 Methods for fabricating SOI devices Chung Long Cheng, Kong-Beng Thei, Sheng-Chen Chung, Tzung-Chi Lee 2010-09-28
7632729 Method for semiconductor device performance enhancement Kong-Beng Thei, Chung Long Cheng, Sheng-Chen Chung, Wen-Huei Guo, Jung-Hui Kao +2 more 2009-12-15
7550795 SOI devices and methods for fabricating the same Chung Long Cheng, Kong-Beng Thei, Sheng-Chen Chung, Tzung-Chi Lee 2009-06-23
7407835 Localized slots for stress relieve in copper 2008-08-05
7332756 Damascene gate structure with a resistive device Chung Long Cheng, Kong-Beng Thei 2008-02-19
7298011 Semiconductor device with recessed L-shaped spacer and method of fabricating the same Kong-Beng Thei, Chung Long Cheng 2007-11-20
7154182 Localized slots for stress relieve in copper 2006-12-26
7030497 Localized slots for stress relieve in copper 2006-04-18
7028277 Process related deviation corrected parasitic capacitance modeling method Victor Chih Yuan Chang, Chung-Shi Chiang, Chien-Wen Chen, Hsin-Yi Lee, Yu-Tai Chia 2006-04-11
6867441 Metal fuse structure for saving layout area Chao-Hsiang Yang, Charles Chen, Wesley Lin, Ming Li, Jeng-Long Huang 2005-03-15
6854100 Methodology to characterize metal sheet resistance of copper damascene process Victor Chih Yuan Chang, Yung-Shun Chen, Shang-Yun Hou 2005-02-08
6831349 Method of forming a novel top-metal fuse structure 2004-12-14
6828223 Localized slots for stress relieve in copper 2004-12-07
6638796 Method of forming a novel top-metal fuse structure 2003-10-28