Patent Leaderboard
USPTO Patent Rankings Data through Sept 30, 2025
MS

Min-Chul Sun

Samsung: 33 patents #3,563 of 75,807Top 5%
SFSeoul National University R&Db Foundation: 5 patents #70 of 2,771Top 3%
IBM: 3 patents #26,272 of 70,183Top 40%
MIT: 2 patents #2,550 of 9,367Top 30%
SFSnu R&Db Foundation: 2 patents #164 of 1,470Top 15%
LLLenovo (Beijing) Limited: 1 patents #602 of 1,308Top 50%
CMChartered Semiconductor Manufacturing: 1 patents #419 of 840Top 50%
Infineon Technologies Ag: 1 patents #4,439 of 7,486Top 60%
BSBeijing Lenovo Software: 1 patents #181 of 493Top 40%
Yongin-si, MA: #6 of 20 inventorsTop 30%
Overall (All Time): #92,026 of 4,157,543Top 3%
36 Patents All Time

Issued Patents All Time

Showing 26–36 of 36 patents

Patent #TitleCo-InventorsDate
7781322 Nickel alloy salicide transistor structure and method for manufacturing same Ja-Hum Ku, Kwan-Jong Roh, Min-Joo Kim 2010-08-24
7772866 Structure and method of mapping signal intensity to surface voltage for integrated circuit inspection Oliver D. Patterson, Horatio S. Wildman 2010-08-10
7679083 Semiconductor integrated test structures for electron beam inspection of semiconductor wafers Scott Jansen, Randy W. Mann, Oliver D. Patterson 2010-03-16
7501651 Test structure of semiconductor device Ja-Hum Ku, Brian J. Greene, Manfred Eller, Roman Knoefler, Zhijiong Luo 2009-03-10
7465617 Method of fabricating a semiconductor device having a silicon oxide layer, a method of fabricating a semiconductor device having dual spacers, a method of forming a silicon oxide layer on a substrate, and a method of forming dual spacers on a conductive material layer Ja-Hum Ku, Chang-Won Lee, Seong-Jun Heo, Sun-Pil Youn 2008-12-16
7317204 Test structure of semiconductor device Ja-Hum Ku, Brian J. Greene, Manfred Eller, Wee Lang Tan, Sunfei Fang +1 more 2008-01-08
7307320 Differential mechanical stress-producing regions for integrated circuit field effect transistors Young Way Teh 2007-12-11
7232756 Nickel salicide process with reduced dopant deactivation Ja-Hum Ku, Kwan-Jong Roh, Min-Joo Kim, Sug-Woo Jung, Sun-Pil Youn 2007-06-19
7084061 Methods of fabricating a semiconductor device having MOS transistor with strained channel Ja-Hum Ku, Sug-Woo Jung, Sun-Pil Youn, Min-Joo Kim, Kwan-Jong Roh 2006-08-01
7005367 Method of fabricating a semiconductor device having a silicon oxide layer, a method of fabricating a semiconductor device having dual spacers, a method of forming a silicon oxide layer on a substrate, and a method of forming dual spacers on a conductive material layer Ja-Hum Ku, Chang-Won Lee, Seong-Jun Heo, Sun-Pil Youn 2006-02-28
6797559 Method of fabricating semiconductor device having metal conducting layer Chang-Won Lee, Si-Young Choi, Seong-Jun Heo, Sung-Man Kim, Ja-Hum Ku +1 more 2004-09-28