Issued Patents All Time
Showing 51–65 of 65 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8242448 | Dynamic power control, beam alignment and focus for nanoscale spectroscopy | Michael Hawjing Lo, Doug Gotthard, Anthony D. Kurtz, Kevin Kjoller | 2012-08-14 |
| 8177422 | Transition temperature microscopy | Kevin Kjoller, Khoren Sahagian, Doug Gotthard, Anthony D. Kurtz, Roshan Shetty +1 more | 2012-05-15 |
| 8166567 | Fast-scanning SPM scanner and method of operating same | Nghi Phan, Craig Cusworth | 2012-04-24 |
| 8161805 | Method and apparatus for obtaining quantitative measurements using a probe based instrument | Chanmin Su, Nghi Phan | 2012-04-24 |
| 8087288 | Scanning stylus atomic force microscope with cantilever tracking and optical access | James Massie, David Grigg, Virgil B. Elings, Paul K. Hansma, Barney Drake | 2012-01-03 |
| 7770231 | Fast-scanning SPM and method of operating same | Chanmin Su, Nghi Phan, Jeffrey M. Markakis, Craig Cusworth, Jian Shi +3 more | 2010-08-03 |
| 7748260 | Thermal mechanical drive actuator, thermal probe and method of thermally driving a probe | Chanmin Su, Robert Clark Daniels | 2010-07-06 |
| 7617719 | Method and apparatus for obtaining material property information of a heterogeneous sample using harmonic resonance imaging | Chanmin Su, Gregory F. Meyers, Bryant R. LaFreniere | 2009-11-17 |
| 7596990 | Method and apparatus for obtaining quantitative measurements using a probe based instrument | Chanmin Su, Nghi Phan | 2009-10-06 |
| 6032518 | Scanning stylus atomic force microscope with cantilever tracking and optical access | James Massie, David Grigg, Virgil B. Elings, Paul K. Hansma, Barney Drake | 2000-03-07 |
| 5714682 | Scanning stylus atomic force microscope with cantilever tracking and optical access | James Massie, David Grigg, Virgil B. Elings, Paul K. Hansma, Barney Drake | 1998-02-03 |
| 5705814 | Scanning probe microscope having automatic probe exchange and alignment | James M. Young, David Grigg, Charles Meyer, William H. Hertzog, John A. Gurley +1 more | 1998-01-06 |
| 5560244 | Scanning stylus atomic force microscope with cantilever tracking and optical access | James Massie, David Grigg, Virgil B. Elings, Paul K. Hansma, Barney Drake | 1996-10-01 |
| 5463897 | Scanning stylus atomic force microscope with cantilever tracking and optical access | James Massie, David Grigg, Virgil B. Elings, Paul K. Hansma, Barney Drake | 1995-11-07 |
| 5166520 | Universal, microfabricated probe for scanning probe microscopes | Thomas Albrecht | 1992-11-24 |