JS

Jian Shi

BN Bruker Nano: 11 patents #6 of 148Top 5%
Huawei: 3 patents #4,041 of 15,535Top 30%
SC Shanghai Liangxin Electrical Co.: 3 patents #3 of 21Top 15%
VI Veeco Instruments: 2 patents #99 of 323Top 35%
AR Agency For Science, Technology And Research: 1 patents #909 of 2,337Top 40%
WARF: 1 patents #1,912 of 4,123Top 50%
Ford: 1 patents #9,341 of 17,473Top 55%
DI Data Storage Institute: 1 patents #19 of 64Top 30%
📍 Shanghai, CA: #267 of 801 inventorsTop 35%
Overall (All Time): #201,752 of 4,157,543Top 5%
21
Patents All Time

Issued Patents All Time

Showing 1–21 of 21 patents

Patent #TitleCo-InventorsDate
12381050 Switch unit and switching device Yang Chang, Zuoyong Gong, Yunfei Lian 2025-08-05
12332124 Deep well grounding electrode and deep well grounding electrode monitoring system Gang Liu, Lu Qu, Yi Bo Zhang, Shangmao Hu, Taishan Hu +9 more 2025-06-17
12315687 Rotary switch Xiufeng Zhang, Hao Wang, Jiang Zhang, Xiaokang Tian 2025-05-27
12300447 Remote switch-off mechanism and rotary switch Hao Wang, Wei Shi, Xiufeng Zhang, Xiaokang Tian 2025-05-13
10663483 Method and apparatus of using peak force tapping mode to measure physical properties of a sample Chanmin Su, Yan Hu, Shuiqing Hu, Ji Ma 2020-05-26
10255939 Recording medium for heat assisted magnetic recording and method of forming the same Jiang Feng Hu, Wen Huei Jack Tsai, Kiat Min Cher, Binni Varghese, Chee Beng Lim 2019-04-09
10197596 Method and apparatus of operating a scanning probe microscope Yan Hu, Shuiqing Hu, Ji Ma, Chanmin Su 2019-02-05
10046813 Part assembly and vehicle deflector assembly employing the same Koby Wang, Joe Wang 2018-08-14
9995765 Method and apparatus of using peak force tapping mode to measure physical properties of a sample Chanmin Su, Yan Hu, Shuiqing Hu, Ji Ma 2018-06-12
9810713 Method and apparatus of operating a scanning probe microscope Yan Hu, Shuiqing Hu, Ji Ma, Chanmin Su 2017-11-07
9523707 Closed loop controller and method for fast scanning probe microscopy Craig Prater, Ji Ma, Chanmin Su 2016-12-20
9291640 Method and apparatus of using peak force tapping mode to measure physical properties of a sample Chanmin Su, Yan Hu, Shuiqing Hu, Ji Ma 2016-03-22
9274139 Method and apparatus of operating a scanning probe microscope Yan Hu, Shuiqing Hu, Ji Ma, Chanmin Su 2016-03-01
9244096 Closed loop controller and method for fast scanning probe microscopy Craig Prater, Ji Ma, Chanmin Su 2016-01-26
8904560 Closed loop controller and method for fast scanning probe microscopy Chanmin Su, Craig Prater, Ji Ma 2014-12-02
8771822 Methods for the growth of three-dimensional nanorod networks Xudong Wang 2014-07-08
8650660 Method and apparatus of using peak force tapping mode to measure physical properties of a sample Yan Hu, Shuiqing Hu, Ji Ma, Chanmin Su 2014-02-11
8646109 Method and apparatus of operating a scanning probe microscope Yan Hu, Shuiqing Hu, Chanmin Su, Ji Ma 2014-02-04
7770231 Fast-scanning SPM and method of operating same Craig Prater, Chanmin Su, Nghi Phan, Jeffrey M. Markakis, Craig Cusworth +3 more 2010-08-03
7555940 Cantilever free-decay measurement system with coherent averaging Chanmin Su 2009-07-07
6641702 Sputtering device Jian-Ping Wang 2003-11-04