JM

Ji Ma

BN Bruker Nano: 13 patents #5 of 148Top 4%
Microsoft: 2 patents #17,506 of 40,388Top 45%
RS Realtek Semiconductor: 1 patents #915 of 1,741Top 55%
TS Texas A&M University System: 1 patents #649 of 1,706Top 40%
XI Xiaomi: 1 patents #253 of 499Top 55%
QU Qualcomm: 1 patents #7,512 of 12,104Top 65%
Overall (All Time): #191,931 of 4,157,543Top 5%
22
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
D1031168 Electric nail clipper Yue Su, Yuanrui Song 2024-06-11
11989798 System and method for processing video 2024-05-21
D1007182 Foam machine Yue Su, Yuanrui Song 2023-12-12
10663483 Method and apparatus of using peak force tapping mode to measure physical properties of a sample Chanmin Su, Jian Shi, Yan Hu, Shuiqing Hu 2020-05-26
10538835 Variably flexible metal article and methods of making the same Ibrahim Karaman, Eric Flickinger 2020-01-21
10197596 Method and apparatus of operating a scanning probe microscope Jian Shi, Yan Hu, Shuiqing Hu, Chanmin Su 2019-02-05
9995765 Method and apparatus of using peak force tapping mode to measure physical properties of a sample Chanmin Su, Jian Shi, Yan Hu, Shuiqing Hu 2018-06-12
9998138 Time-multiplexed successive approximation register (SAR) analog-to-digital converter (ADC) circuits for multi-channel receivers Yan Wang, Chieh-Yu Hsieh, Seyed Arash Mirhaj, Dinesh Jagannath Alladi 2018-06-12
9869694 Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode Chunzeng Li, Yan Hu, Jianli He, Lin Huang, Stephen C. Minne +4 more 2018-01-16
9810713 Method and apparatus of operating a scanning probe microscope Jian Shi, Yan Hu, Shuiqing Hu, Chanmin Su 2017-11-07
9752219 Self-adaptive, ultra-low elastic modulus shape memory alloys Ibrahim Karaman 2017-09-05
9523707 Closed loop controller and method for fast scanning probe microscopy Jian Shi, Craig Prater, Chanmin Su 2016-12-20
9426130 Methods, devices and systems for anti-counterfeiting authentication Wei Liu, Sen Ma, Liang Zhang 2016-08-23
9291640 Method and apparatus of using peak force tapping mode to measure physical properties of a sample Chanmin Su, Jian Shi, Yan Hu, Shuiqing Hu 2016-03-22
9274139 Method and apparatus of operating a scanning probe microscope Jian Shi, Yan Hu, Shuiqing Hu, Chanmin Su 2016-03-01
9244096 Closed loop controller and method for fast scanning probe microscopy Jian Shi, Craig Prater, Chanmin Su 2016-01-26
9213047 Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode Chunzeng Li, Yan Hu, Jianli He, Lin Huang, Stephen C. Minne +4 more 2015-12-15
8904560 Closed loop controller and method for fast scanning probe microscopy Jian Shi, Chanmin Su, Craig Prater 2014-12-02
8650660 Method and apparatus of using peak force tapping mode to measure physical properties of a sample Jian Shi, Yan Hu, Shuiqing Hu, Chanmin Su 2014-02-11
8646109 Method and apparatus of operating a scanning probe microscope Yan Hu, Shuiqing Hu, Chanmin Su, Jian Shi 2014-02-04
7260780 Method and apparatus for providing foreign language text display when encoding is not available 2007-08-21
6892326 Systems and methods for monitoring object activity through an external agent using a proxy object Tuan D. Le 2005-05-10