Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9869694 | Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode | Yan Hu, Ji Ma, Jianli He, Lin Huang, Stephen C. Minne +4 more | 2018-01-16 |
| 9213047 | Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode | Yan Hu, Ji Ma, Jianli He, Lin Huang, Stephen C. Minne +4 more | 2015-12-15 |
| 7156965 | Scanning electrochemical potential microscope | Kevin Kjoller | 2007-01-02 |