Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12345147 | Multi-stage temporary plugging fracturing method based on stress cage effect, device thereof and storage medium | Daobing Wang, Bo Yu, Mao Sheng, Zhiheng Tao, Yiqun Yan +4 more | 2025-07-01 |
| 11555827 | Torsion wing probe assembly | Martin Wagner, Weijie Wang, Chanmin Su | 2023-01-17 |
| 11119118 | Torsion wing probe assembly | Martin Wagner, Weijie Wang, Chanmin Su | 2021-09-14 |
| 11002757 | Method and apparatus of operating a scanning probe microscope | Yan Hu, Chanmin Su | 2021-05-11 |
| 10663483 | Method and apparatus of using peak force tapping mode to measure physical properties of a sample | Chanmin Su, Jian Shi, Yan Hu, Ji Ma | 2020-05-26 |
| 10502761 | Method and apparatus of operating a scanning probe microscope | Yan Hu, Chanmin Su | 2019-12-10 |
| 10197596 | Method and apparatus of operating a scanning probe microscope | Jian Shi, Yan Hu, Ji Ma, Chanmin Su | 2019-02-05 |
| 10175263 | Sample vessel retention structure for scanning probe microscope | Charles Meyer, James D. Shaw, Chanmin Su | 2019-01-08 |
| 9995765 | Method and apparatus of using peak force tapping mode to measure physical properties of a sample | Chanmin Su, Jian Shi, Yan Hu, Ji Ma | 2018-06-12 |
| 9910064 | Force measurement with real-time baseline determination | Changchun Liu, Bede Pittenger, Chanmin Su | 2018-03-06 |
| 9869694 | Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode | Chunzeng Li, Yan Hu, Ji Ma, Jianli He, Lin Huang +4 more | 2018-01-16 |
| 9810713 | Method and apparatus of operating a scanning probe microscope | Jian Shi, Yan Hu, Ji Ma, Chanmin Su | 2017-11-07 |
| 9739799 | Method and apparatus to compensate for deflection artifacts in an atomic force microscope | Chanmin Su | 2017-08-22 |
| 9588136 | Method and apparatus of operating a scanning probe microscope | Yan Hu, Chanmin Su | 2017-03-07 |
| 9575090 | Force measurement with real-time baseline determination | Changchun Liu, Bede Pittenger, Chanmin Su | 2017-02-21 |
| 9322842 | Method and apparatus of operating a scanning probe microscope | Yan Hu, Chanmin Su | 2016-04-26 |
| 9291640 | Method and apparatus of using peak force tapping mode to measure physical properties of a sample | Chanmin Su, Jian Shi, Yan Hu, Ji Ma | 2016-03-22 |
| 9274139 | Method and apparatus of operating a scanning probe microscope | Jian Shi, Yan Hu, Ji Ma, Chanmin Su | 2016-03-01 |
| 9213047 | Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode | Chunzeng Li, Yan Hu, Ji Ma, Jianli He, Lin Huang +4 more | 2015-12-15 |
| 9116167 | Method and apparatus of tuning a scanning probe microscope | Chanmin Su, Paul Silva, Lin Huang, Bede Pittenger | 2015-08-25 |
| 8997259 | Method and apparatus of tuning a scanning probe microscope | Chanmin Su, Paul Silva, Lin Huang, Bede Pittenger | 2015-03-31 |
| 8739309 | Method and apparatus of operating a scanning probe microscope | Yan Hu, Chanmin Su | 2014-05-27 |
| 8650660 | Method and apparatus of using peak force tapping mode to measure physical properties of a sample | Jian Shi, Yan Hu, Ji Ma, Chanmin Su | 2014-02-11 |
| 8646109 | Method and apparatus of operating a scanning probe microscope | Yan Hu, Chanmin Su, Jian Shi, Ji Ma | 2014-02-04 |