Issued Patents All Time
Showing 25 most recent of 56 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11555827 | Torsion wing probe assembly | Shuiqing Hu, Martin Wagner, Weijie Wang | 2023-01-17 |
| 11119118 | Torsion wing probe assembly | Shuiqing Hu, Martin Wagner, Weijie Wang | 2021-09-14 |
| 11002757 | Method and apparatus of operating a scanning probe microscope | Yan Hu, Shuiqing Hu | 2021-05-11 |
| 10845382 | Infrared characterization of a sample using oscillating mode | Martin Wagner, Xiaoji Xu | 2020-11-24 |
| 10663483 | Method and apparatus of using peak force tapping mode to measure physical properties of a sample | Jian Shi, Yan Hu, Shuiqing Hu, Ji Ma | 2020-05-26 |
| 10520426 | Peakforce photothermal-based detection of IR nanoabsorption | Gregory Olegovic Andreev | 2019-12-31 |
| 10502761 | Method and apparatus of operating a scanning probe microscope | Yan Hu, Shuiqing Hu | 2019-12-10 |
| 10345337 | Scanning probe microscopy utilizing separable components | Izhar Medalsy, Weijie Wang | 2019-07-09 |
| 10197595 | Dual-probe scanning probe microscope | — | 2019-02-05 |
| 10197596 | Method and apparatus of operating a scanning probe microscope | Jian Shi, Yan Hu, Shuiqing Hu, Ji Ma | 2019-02-05 |
| 10175263 | Sample vessel retention structure for scanning probe microscope | Charles Meyer, Shuiqing Hu, James D. Shaw | 2019-01-08 |
| 9995765 | Method and apparatus of using peak force tapping mode to measure physical properties of a sample | Jian Shi, Yan Hu, Shuiqing Hu, Ji Ma | 2018-06-12 |
| 9933453 | Chemical nano-identification of a sample using normalized near-field spectroscopy | Gregory Olegovic Andreev, Sergey Osechinskiy, Stephen C. Minne | 2018-04-03 |
| 9910064 | Force measurement with real-time baseline determination | Changchun Liu, Bede Pittenger, Shuiqing Hu | 2018-03-06 |
| 9869694 | Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode | Chunzeng Li, Yan Hu, Ji Ma, Jianli He, Lin Huang +4 more | 2018-01-16 |
| 9846178 | Chemical nano-identification of a sample using normalized near-field spectroscopy | Gregory Olegovic Andreev, Sergey Osechinskiy, Stephen C. Minne | 2017-12-19 |
| 9810713 | Method and apparatus of operating a scanning probe microscope | Jian Shi, Yan Hu, Shuiqing Hu, Ji Ma | 2017-11-07 |
| 9739799 | Method and apparatus to compensate for deflection artifacts in an atomic force microscope | Shuiqing Hu | 2017-08-22 |
| 9719916 | PeakForce photothermal-based detection of IR nanoabsorption | Gregory Olegovic Andreev | 2017-08-01 |
| 9709597 | Miniaturized cantilever probe for scanning probe microscopy and fabrication thereof | Weijie Wang | 2017-07-18 |
| 9588136 | Method and apparatus of operating a scanning probe microscope | Yan Hu, Shuiqing Hu | 2017-03-07 |
| 9575090 | Force measurement with real-time baseline determination | Changchun Liu, Bede Pittenger, Shuiqing Hu | 2017-02-21 |
| 9523707 | Closed loop controller and method for fast scanning probe microscopy | Jian Shi, Craig Prater, Ji Ma | 2016-12-20 |
| 9448252 | Chemical nano-identification of a sample using normalized near-field spectroscopy | Gregory Olegovic Andreev, Sergey Osechinskiy, Stephen C. Minne | 2016-09-20 |
| 9322842 | Method and apparatus of operating a scanning probe microscope | Yan Hu, Shuiqing Hu | 2016-04-26 |