Issued Patents All Time
Showing 26–50 of 65 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10557789 | Nanoscale infrared spectroscopy with multi-frequency atomic force microscopy | Kevin Kjoller, Doug Gotthard, Qichi Hu | 2020-02-11 |
| 10473693 | Method and apparatus for infrared scanning near-field optical microscopy based on photothermal effect | Honghua Yang | 2019-11-12 |
| 10241131 | Method and apparatus for chemical and optical imaging with a broadband source | — | 2019-03-26 |
| 10228388 | Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy | Kevin Kjoller | 2019-03-12 |
| 10228389 | Method and apparatus for infrared scattering scanning near-field optical microscopy with background suppression | Honghua Yang | 2019-03-12 |
| 10082523 | Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy | Honghua Yang, Kevin Kjoller, Sam Berweger | 2018-09-25 |
| 9778282 | Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy | Honghua Yang, Kevin Kjoller, Sam Berweger | 2017-10-03 |
| 9658247 | Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy | Honghua Yang, Kevin Kjoller, Sam Berweger | 2017-05-23 |
| 9523707 | Closed loop controller and method for fast scanning probe microscopy | Jian Shi, Ji Ma, Chanmin Su | 2016-12-20 |
| 9372154 | Method and apparatus for infrared scattering scanning near-field optical microscopy | — | 2016-06-21 |
| 9244096 | Closed loop controller and method for fast scanning probe microscopy | Jian Shi, Ji Ma, Chanmin Su | 2016-01-26 |
| 9134341 | Multiple modulation heterodyne infrared spectroscopy | Kevin Kjoller | 2015-09-15 |
| 9046492 | Stimulated raman nanospectroscopy | — | 2015-06-02 |
| 8914911 | Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy | William P. King, Byeonghee Lee, Doug Gotthard | 2014-12-16 |
| 8904560 | Closed loop controller and method for fast scanning probe microscopy | Jian Shi, Chanmin Su, Ji Ma | 2014-12-02 |
| 8869602 | High frequency deflection measurement of IR absorption | Mikhail A. Belkin, Feng Lu, Vladislav V. Yakolev, Kevin Kjoller, Markus B. Raschke | 2014-10-28 |
| 8793811 | Method and apparatus for infrared scattering scanning near-field optical microscopy | Markus B. Raschke, Sam Berweger | 2014-07-29 |
| 8680467 | High frequency deflection measurement of IR absorption with a modulated IR source | Kevin Kjoller | 2014-03-25 |
| 8646319 | Dynamic power control for nanoscale spectroscopy | Kevin Kjoller | 2014-02-11 |
| 8533861 | Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy | William P. King, Byeonghee Lee | 2013-09-10 |
| 8443459 | Fast-scanning SPM scanner and method of operating same | Nghi Phan, Craig Cusworth | 2013-05-14 |
| 8418538 | High frequency deflection measurement of IR absorption | A. Dazzi Dazzi, Clotilde Policar, Kevin Kjoller, Michael Reading, Konstantin Vodopyanov | 2013-04-16 |
| 8402819 | High frequency deflection measurement of IR absorption | A. Dazzi Dazzi, Clotilde Policar, Kevin Kjoller, Michael Reading, Konstantin Vodopyanov | 2013-03-26 |
| 8387443 | Microcantilever with reduced second harmonic while in contact with a surface and nano scale infrared spectrometer | William P. King, Jonathan R. Felts, Kevin Kjoller | 2013-03-05 |
| 8322220 | Non-destructive wafer-scale sub-surface ultrasonic microscopy employing near field AFM detection | Chanmin Su | 2012-12-04 |