Michael Reading — 23 Patents at Ta Instruments

Michael Reading has been granted 23 US patents while listed as an inventor at Ta Instruments. The first was granted in 1993 and the most recent in October 2021. Michael Reading ranks #178,160 of 4,157,543 US inventors in our database (top 4.3%). Patent records list Michael Reading in Dereham, GA, GB.

Issued Patents All Time

Showing 1–23 of 23 patents

Patent #	Title	Co-Inventors	Date
11143581	Method and apparatus for chemical mapping by selective dissolution	—	2021-10-12
10234369	Method and apparatus for chemical mapping by selective dissolution	—	2019-03-19
8607622	High frequency deflection measurement of IR absorption	Alexandre Dazzi, Rui Prazeres, Kevin Kjoller	2013-12-17
8418538	High frequency deflection measurement of IR absorption	A. Dazzi Dazzi, Clotilde Policar, Kevin Kjoller, Konstantin Vodopyanov, Craig Prater	2013-04-16
8402819	High frequency deflection measurement of IR absorption	A. Dazzi Dazzi, Clotilde Policar, Kevin Kjoller, Konstantin Vodopyanov, Craig Prater	2013-03-26
8177422	Transition temperature microscopy	Kevin Kjoller, Khoren Sahagian, Doug Gotthard, Anthony D. Kurtz, Craig Prater +1 more	2012-05-15
8001830	High frequency deflection measurement of IR absorption	Alexandre Dazzi, Rui Prazeres, Kevin Kjoller	2011-08-23
7578613	Modulated differential scanning calorimeter solvent loss calibration apparatus and method	—	2009-08-25
7366704	System and method for deconvoluting the effect of topography on scanning probe microscopy measurements	Duncan Michael Price	2008-04-29
6654117	Bottle cap sensor apparatus and method	—	2003-11-25
6641300	Differential scanning calorimeter	Andrew Lacey	2003-11-04
6491425	Method and apparatus for performing localized thermal analysis and sub-surface imaging by scanning thermal microscopy	Azzedine Hammiche, Hubert Murray Montagu-Pollock, Mo Song	2002-12-10
6405137	Method and apparatus for performing chemical analysis using imaging by scanning thermal microscopy	—	2002-06-11
6260997	Method and apparatus for high spatial resolution spectroscopic microscopy	Michael Claybourn, Azzedine Hammiche, Hubert Murray Montagu-Pollock	2001-07-17
6200022	Method and apparatus for localized dynamic mechano-thermal analysis with scanning probe microscopy	Azzedine Hammiche, Hubert Murray Montague-Pollock	2001-03-13
6095679	Method and apparatus for performing localized thermal analysis and sub-surface imaging by scanning thermal microscopy	Azzedine Hammiche, Hubert Murray Montagu Pollock, Mo Song	2000-08-01
5624187	Method and apparatus for gas flow modulated differential scanning calorimetry	—	1997-04-29
5474385	Method and apparatus for parsed dynamic differential analysis	—	1995-12-12
5439291	Method and apparatus for AC Differential thermal analysis	—	1995-08-08
5346306	Method and apparatus for modulated differential analysis	Brian K. Hahn, Benjamin S. Crowe	1994-09-13
5335993	Method and apparatus for thermal conductivity measurements	Sanford M. Marcus	1994-08-09
5248199	Method and apparatus for spatially resolved modulated differential analysis	—	1993-09-28
5224775	Method and apparatus for modulated differential analysis	Brian K. Hahn, Benjamin S. Crowe	1993-07-06

Michael Reading — 23 Patents

Issued Patents All Time

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