Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11994533 | Methods and systems for scanning probe sample property measurement and imaging | Rafael Piestun, Simon Labouesse, Eric Dickeson Muller, Samuel Johnson | 2024-05-28 |
| 9052336 | Method and apparatus of physical property measurement using a probe-based nano-localized light source | Stefan B. Kaemmer, Stephen C. Minne, Chanmin Su | 2015-06-09 |
| 8881311 | Method and apparatus of physical property measurement using a probe-based nano-localized light source | Stefan B. Kaemmer, Stephen C. Minne, Chanmin Su | 2014-11-04 |
| 8869602 | High frequency deflection measurement of IR absorption | Mikhail A. Belkin, Feng Lu, Vladislav V. Yakolev, Craig Prater, Kevin Kjoller | 2014-10-28 |
| 8793811 | Method and apparatus for infrared scattering scanning near-field optical microscopy | Craig Prater, Sam Berweger | 2014-07-29 |
| 7977636 | Infrared imaging using thermal radiation from a scanning probe tip | — | 2011-07-12 |