Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Each inspection units of a probe apparatus is provided with an imaging unit to take an image of a wafer

Each inspection units of a probe apparatus is provided with an imaging unit to take an image of a wafer

US Patent 7701236 · Granted Apr 20, 2010

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Vehicle allocation control device, vehicle allocation control system, and vehicl2025
Information processing device, non-transitory storage medium, information proces2025
Information processing apparatus, imaging system, and information processing met2025
Test device, change kit, and method of exchanging change kit2024
Test device, change kit, and method of exchanging change kit2024
Control device for protecting power storage device2024
Video modification and transmission using tokens2024
Service providing system, business analysis support system, and method2024
Inner wall and substrate processing apparatus2024
Vehicle control system2024
Drive shaft and method of producing drive shaft2024
Substrate holding mechanism, substrate mounting method, and substrate detaching 2024