Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Probe pins with etched tips for electrical die test

Probe pins with etched tips for electrical die test

US Patent 11340258 · Granted May 24, 2022

Estimated economic value: $18,289,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

BGA stiffener attachment with low Eolife adhesive strength at high solder joint 2025
Omni directional interconnect with magnetic fillers in mold matrix2025
Low force liquid metal interconnect solutions2025
Methods and apparatus to reduce defects in interconnects between semiconductor d2025
Method to enable 30 microns pitch EMIB or below2025
Package substrate z-disaggregation with liquid metal interconnects2025
Dummy die structures of a packaged integrated circuit device2024
Selectively roughened copper architectures for low insertion loss conductive fea2024
Patternable die attach materials and processes for patterning2024
Sacrificial redistribution layer in microelectronic assemblies having direct bon2023
Method to enable 30 microns pitch EMIB or below2023
Low force liquid metal interconnect solutions2023