JK

Jiro Kajiwara

MI Multiplanar Technologies Incorporated: 11 patents #1 of 11Top 10%
MM Mitsubishi Materials: 4 patents #258 of 1,543Top 20%
CS Cybeq Systems: 2 patents #1 of 14Top 8%
EB Ebara: 2 patents #752 of 1,611Top 50%
SU Sumco: 1 patents #248 of 464Top 55%
Overall (All Time): #219,064 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11554458 Polishing head, wafer polishing apparatus using the same, and wafer polishing method using the same Yuki Nakano, Katsuhisa SUGIMORI, Kazuaki Kozasa, Katsutoshi Yamamoto, Takayuki Kihara +1 more 2023-01-17
9250014 Vacuum storage method and device for crystalline material Yukichi Horioka, Hirotsugu Sanada 2016-02-02
7311586 Apparatus and method for chemical-mechanical polishing (CMP) head having direct pneumatic wafer polishing pressure Gerard S. Maloney, Jason Price, Scott Chin, Malik Charif 2007-12-25
7118456 Polishing head, retaining ring for use therewith and method fo polishing a substrate Gerard Moloney 2006-10-10
7029382 Apparatus for chemical-mechanical polishing (CMP) head having direct pneumatic wafer polishing pressure Gerard S. Maloney, Jason Price, Scott Chin, Malik Charif 2006-04-18
6966822 System and method for CMP having multi-pressure zone loading for improved edge and annular zone material removal control Gerard Moloney, Huey-Ming Wang, David A. Hansen, Alejandro Reyes 2005-11-22
6893327 Chemical mechanical polishing apparatus and method having a retaining ring with a contoured surface Gerard Moloney, Huey-Ming Wang, Junsheng Yang 2005-05-17
6887132 Slurry distributor for chemical mechanical polishing apparatus and method of using the same Gerard Moloney, Jun Liu, Junsheng Yang, Ernesto Saldana, Cormac Walsh +1 more 2005-05-03
6641461 Chemical mechanical polishing apparatus having edge, center and annular zone control of material removal Huey-Ming Wang, David A. Hansen, Gerard Moloney 2003-11-04
6623343 System and method for CMP head having multi-pressure annular zone subcarrier material removal control Gerard Moloney, Huey-Ming Wang, David A. Hansen, Alejandro Reyes 2003-09-23
6558232 System and method for CMP having multi-pressure zone loading for improved edge and annular zone material removal control Gerard Moloney, Huey-Ming Wang, David A. Hansen, Alejandro Reyes 2003-05-06
6540590 Chemical mechanical polishing apparatus and method having a rotating retaining ring Huey-Ming Wang 2003-04-01
6527625 Chemical mechanical polishing apparatus and method having a soft backed polishing head David A. Hansen, Gerard Moloney 2003-03-04
6508696 Wafer-polishing head and polishing apparatus having the same Tatsunori Kobayashi, Hiroshi Tanaka 2003-01-21
6506105 System and method for pneumatic diaphragm CMP head having separate retaining ring and multi-region wafer pressure control Gerard Moloney, Huey-Ming Wang, David A. Hansen, Alejandro Reyes 2003-01-14
6398906 Wafer transfer apparatus and wafer polishing apparatus, and method for manufacturing wafer Tatsunori Kobayashi, Hiroshi Tanaka 2002-06-04
6368189 Apparatus and method for chemical-mechanical polishing (CMP) head having direct pneumatic wafer polishing pressure Gerard S. Maloney, Jason Price, Scott Chin, Malek Charif 2002-04-09
6346038 Wafer loading/unloading device and method for producing wafers Yoshie Kaido, Masahito Komasaki 2002-02-12
5527209 Wafer polisher head adapted for easy removal of wafers Konstantine Volodarsky, Herbert W. Owens, Jr., Jan H. King 1996-06-18
5443416 Rotary union for coupling fluids in a wafer polishing apparatus Konstantine Volodarsky, Herbert W. Owens, Jr., Jan H. King 1995-08-22