Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12285840 | Polishing head, polishing apparatus, and method of manufacturing semiconductor wafer | Yuki Nakano, Ryoya TERAKAWA, Hiroki Ota | 2025-04-29 |
| 12120103 | Information processing system, information processing method, and program | Shota ONO, Yoshitaka Yoshimura, Tomohisa Shimizu, Shinichi TORIYAMA, Masahiro Kiyosawa | 2024-10-15 |
| 11959892 | Liquid chromatograph with improved defect elimination | Hiroshi Ohashi, Hiroshi Miura | 2024-04-16 |
| 11554458 | Polishing head, wafer polishing apparatus using the same, and wafer polishing method using the same | Yuki Nakano, Katsuhisa SUGIMORI, Kazuaki Kozasa, Jiro Kajiwara, Katsutoshi Yamamoto +1 more | 2023-01-17 |
| 11274371 | Susceptor and epitaxial growth device | Shoji Nogami, Naoyuki Wada, Masaya Sakurai | 2022-03-15 |
| 10511501 | Analyzing device system and program for the system | — | 2019-12-17 |
| 10455239 | Information display processing device and control program for information display processing device | — | 2019-10-22 |
| 9739756 | Data processing system and method for chromatograph | — | 2017-08-22 |
| 9190267 | Epitaxial silicon wafer and production method thereof | Kazushige Takaishi, Yasuyuki Hashimoto | 2015-11-17 |
| 8765492 | Silicon wafer and method of manufacturing same | Toshiaki Ono, Yumi Hoshino | 2014-07-01 |
| 8685855 | Tray for CVD and method for forming film using same | Takashi Nakayama, Tomoyuki Kabasawa | 2014-04-01 |
| 8080106 | Epitaxial silicon wafer and production method thereof | Kazushige Takaishi, Yasuyuki Hashimoto | 2011-12-20 |
| 8067820 | Silocon wafer supporting method, heat treatment jig and heat-treated wafer | — | 2011-11-29 |
| 7226571 | High resistivity silicon wafer and method for fabricating the same | Nobumitsu Takase, Shinsuke Sadamitsu, Masataka Hourai | 2007-06-05 |
| 7225360 | Automatic analysis apparatus and method for controlling an analysis unit | — | 2007-05-29 |
| 6803242 | Evaluation method of IG effectivity in semiconductor silicon substrates | Shinsuke Sadamitsu, Koji Sueoka | 2004-10-12 |
| 5818610 | Scanner frame | Eric Bromley, Yoshiyuki Okamura | 1998-10-06 |