| 7120073 |
Integrated circuit devices having reducing variable retention characteristics |
Russell L. Meyer |
2006-10-10 |
$1,925,000 |
| 7069484 |
System for optimizing anti-fuse repair time using fuse id |
— |
2006-06-27 |
$1,742,000 |
| RE38956 |
Data compression circuit and method for testing memory devices |
Leland R. Nevill, Neil L. Hansen, Eugene H. Cloud |
2006-01-31 |
|
| 6898138 |
Method of reducing variable retention characteristics in DRAM cells |
Russell L. Meyer |
2005-05-24 |
$1,184,000 |
| 6625073 |
Apparatus and method for testing for defects between memory cells in packaged semiconductor memory devices |
— |
2003-09-23 |
$3,145,000 |
| 6622270 |
System for optimizing anti-fuse repair time using fuse ID |
— |
2003-09-16 |
$4,026,000 |
| 6477662 |
Apparatus and method implementing repairs on a memory device |
William K. Waller, Lee R. Nevill, Warren M. Farnworth, Eugene H. Cloud |
2002-11-05 |
$4,128,000 |
| 6442719 |
Method and apparatus for detecting intercell defects in a memory device |
William K. Waller |
2002-08-27 |
$3,113,000 |
| 6347386 |
System for optimizing the testing and repair time of a defective integrated circuit |
— |
2002-02-12 |
$25,107,000 |
| 6233185 |
Wafer level burn-in of memory integrated circuits |
Leland R. Nevill, Warren M. Farnworth, Eugene H. Cloud, William K. Waller |
2001-05-15 |
$12,663,000 |
| 6181154 |
Method and apparatus for testing of dielectric defects in a packaged semiconductor memory device |
— |
2001-01-30 |
$19,316,000 |
| 6145092 |
Apparatus and method implementing repairs on a memory device |
William K. Waller, Lee R. Nevill, Warren M. Farnworth, Eugene H. Cloud |
2000-11-07 |
$10,334,000 |
| 6128756 |
System for optimizing the testing and repair time of a defective integrated circuit |
— |
2000-10-03 |
$14,395,000 |
| 6119251 |
Self-test of a memory device |
Eugene H. Cloud, Leland R. Nevill, Warren M. Farnworth |
2000-09-12 |
$16,941,000 |
| 6094734 |
Test arrangement for memory devices using a dynamic row for creating test data |
Eugene H. Cloud, Leland R. Nevill, Ken Waller, Warren M. Farnworth |
2000-07-25 |
$31,586,000 |
| 6079037 |
Method and apparatus for detecting intercell defects in a memory device |
William K. Waller |
2000-06-20 |
$36,484,000 |
| 6058056 |
Data compression circuit and method for testing memory devices |
Leland R. Nevill, Neil L. Hansen, Eugene H. Cloud |
2000-05-02 |
$28,481,000 |
| 6032264 |
Apparatus and method implementing repairs on a memory device |
William K. Waller, Lee R. Nevill, Warren M. Farnworth, Eugene H. Cloud |
2000-02-29 |
$20,825,000 |
| 6003149 |
Test method and apparatus for writing a memory array with a reduced number of cycles |
Leland R. Nevill, Ken Waller, Eugene H. Cloud, Warren M. Farnworth |
1999-12-14 |
$16,076,000 |
| 5982682 |
Self-test circuit for memory integrated circuits |
Leland R. Nevill, Warren M. Farnworth, Gene Cloud |
1999-11-09 |
$11,356,000 |
| 5965902 |
Method and apparatus for testing of dielectric defects in a packaged semiconductor memory device |
— |
1999-10-12 |
$21,791,000 |
| 5966025 |
Method and apparatus for testing of dielectric defects in a packaged semiconductor memory device |
— |
1999-10-12 |
$21,791,000 |
| 5910921 |
Self-test of a memory device |
William K. Waller, Eugene H. Cloud, Warren M. Farnworth, Leland R. Nevill |
1999-06-08 |
$19,228,000 |
| 5898629 |
System for stressing a memory integrated circuit die |
Leland R. Nevill, Warren M. Farnworth, Eugene H. Cloud, William K. Waller |
1999-04-27 |
$8,461,000 |
| 5885846 |
Method and apparatus for testing of dielectric defects in a packaged semiconductor memory device |
— |
1999-03-23 |
$9,133,000 |
