Issued Patents All Time
Showing 26–29 of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5867505 | Method and apparatus for testing an integrated circuit including the step/means for storing an associated test identifier in association with integrated circuit identifier for each test to be performed on the integrated circuit | — | 1999-02-02 |
| 5852581 | Method of stress testing memory integrated circuits | Leland R. Nevill, Warren M. Farnworth, Eugene H. Cloud, William K. Waller | 1998-12-22 |
| 5754486 | Self-test circuit for memory integrated circuits | Leland R. Nevill, Warren M. Farnworth, Gene Cloud | 1998-05-19 |
| 5657284 | Apparatus and method for testing for defects between memory cells in packaged semiconductor memory devices | — | 1997-08-12 |