CC

Christophe J. Chevallier

Micron: 155 patents #67 of 6,345Top 2%
US Unity Semiconductor: 119 patents #1 of 55Top 2%
QU Qualcomm: 22 patents #1,021 of 12,104Top 9%
AM Ambiq Micro: 10 patents #4 of 26Top 20%
KT Kilopass Technology: 9 patents #5 of 29Top 20%
HL Hefei Reliance Memory Limited: 7 patents #7 of 28Top 25%
Applied Materials: 3 patents #2,994 of 7,310Top 45%
CS Catalyst Semiconductor: 3 patents #9 of 41Top 25%
VC Valeo Climatisation: 3 patents #19 of 116Top 20%
RR Round Rock Research: 2 patents #110 of 239Top 50%
TL Tc Lab: 1 patents #5 of 8Top 65%
FR Freewing Aerial Robotics: 1 patents #3 of 4Top 75%
VH Valeo Thermique Habitacle: 1 patents #8 of 13Top 65%
RA Rambus: 1 patents #410 of 549Top 75%
SS Sgs-Thomson Microelectronics S.A.: 1 patents #534 of 957Top 60%
📍 Palo Alto, CA: #5 of 9,675 inventorsTop 1%
🗺 California: #175 of 386,348 inventorsTop 1%
Overall (All Time): #970 of 4,157,543Top 1%
338
Patents All Time

Issued Patents All Time

Showing 126–150 of 338 patents

Patent #TitleCo-InventorsDate
7633790 Multi-resistive state memory device with conductive oxide electrodes Darrel Rinerson, Wayne Kinney, Edmond R. Ward, Steve Kuo-Ren Hsia, Steven W. Longcor +2 more 2009-12-15
7569414 CMOS imager with integrated non-volatile memory 2009-08-04
7538338 Memory using variable tunnel barrier widths Darrell Rinerson, Wayne Kinney, Edmond R. Ward 2009-05-26
7528405 Conductive memory stack with sidewall Darrell Rinerson, Steve Kuo-Ren Hsia, Steven W. Longcor 2009-05-05
7505347 Method for sensing a signal in a two-terminal memory array having leakage current Darrell Rinerson, Chang Hua Siau 2009-03-17
7457997 Apparatus and method for detecting over-programming condition in multistate memory device Robert Norman 2008-11-25
7457147 Two terminal memory array having reference cells Darrell Rinerson, Steven W. Longcor 2008-11-25
7437647 Mode entry circuit and method 2008-10-14
7436723 Method for two-cycle sensing in a two-terminal memory array having leakage current Darrell Rinerson, Chang Hua Siau 2008-10-14
7428714 Line width error check Adriana Ababei 2008-09-23
7394679 Multi-resistive state element with reactive metal Darrell Rinerson, Wayne Kinney, Edmond R. Ward, Steve Kuo-Ren Hsia, Steven W. Longcor +2 more 2008-07-01
7382645 Two terminal memory array having reference cells Darrell Rinerson, Steven W. Longcor 2008-06-03
7382644 Two terminal memory array having reference cells Darrell Rinerson, Steven W. Longcor 2008-06-03
7379364 Sensing a signal in a two-terminal memory array having leakage current Chang Hua Siau, Darrell Rinerson 2008-05-27
7372753 Two-cycle sensing in a two-terminal memory array having leakage current Darrell Rinerson, Chang Hua Siau 2008-05-13
7330370 Enhanced functionality in a two-terminal memory array Darrell Rinerson, Steven W. Longcor, Edmond R. Ward, Robert Norman 2008-02-12
7327601 Providing a reference voltage to a cross point memory array Darrell Rinerson 2008-02-05
7326979 Resistive memory device with a treated interface Darrell Rinerson, Wayne Kinney, John Sanchez, Steven W. Longcor, Steve Kuo-Ren Hsia +1 more 2008-02-05
7251187 Memory system, method and predecoding circuit operable in different modes for selectively accessing multiple blocks of memory cells for simultaneous writing or erasure Vinod Lakhani, Mathew L. Adsitt 2007-07-31
7248515 Non-volatile memory with test rows for disturb detection 2007-07-24
7236399 Method for erase-verifying a non-volatile memory capable of identifying over-erased and under-erased memory cells 2007-06-26
7236400 Erase verify for non-volatile memory using a bitline current-to-voltage converter 2007-06-26
7230855 Erase verify for non-volatile memory using bitline/reference current-to-voltage converters 2007-06-12
7227775 Two terminal memory array having reference cells Darrell Rinerson, Steven W. Longcor 2007-06-05
7227767 Cross point memory array with fast access time Darrell Rinerson 2007-06-05